Abstract:The resonant optical excitation of dielectric nanostructures offers unique opportunities for developing remarkable nanophotonic devices. Light that is structured by tailoring the vectorial characteristics of the light beam provides an additional degree of freedom in achieving flexible control of multipolar resonances at the nanoscale. Here, we investigate the nonlinear scattering of subwavelength silicon (Si) nanostructures with radially and azimuthally polarized cylindrical vector beams to show a strong dependence of the photothermal nonlinearity on the polarization state of the applied light. The resonant magnetic dipole, selectively excited by an azimuthally polarized beam, enables enhanced photothermal nonlinearity, thereby inducing large scattering saturation. In contrast, radially polarized beam illumination shows no observable nonlinearity owing to off-resonance excitation. Numerical analysis reveals a difference of more than 2 orders of magnitude in photothermal nonlinearity under two types of polarization excitations. Nonlinear scattering and the unique doughnut-shaped focal spot generated by the azimuthally polarized beam are demonstrated as enabling far-field high-resolution localization of nanostructured Si with an accuracy approaching 50 nm. Our study extends the horizons of active Si photonics and holds great potential for label-free superresolution imaging of Si nanostructures.

Broadband Transverse Displacement Sensing of Silicon Hollow Nanodisk under Focused Radial Polarization Illumination in the Near-Infrared Region

Axial nanodisplacement measurement based on the double-helix point spread function generated using radially polarized beams with vortex phase modulation

Axial nano-displacement measurement with high resolution and wide range based on asymmetrical illumination.

An Axial Displacement Measurement Relying on the Double-Helix Light Beam

Nano-Displacement Measurement Based On Virtual Pinhole Confocal Method

Nanometer-scale Displacement Sensor Based on Phase-Sensitive Diffraction Grating.

Broadband Unidirectional Scattering in the Transverse Direction and Angular Radiation Realized by Using a Silicon Hollow Nanodisk under a Radially Polarized Beam

Unidirectional Scattering Exploited Transverse Displacement Sensor with Tunable Measuring Range

Nanometric Displacement Sensor with a Switchable Measuring Range Using a Cylindrical Vector Beam Excited Silicon Nanoantenna.

An ultracompact high-resolution displacement sensor based on self-interference effect of single optical nanograting

Magnetic transverse unidirectional scattering and longitudinal displacement sensing in silicon nanodimer

Cylindrical Vector Beam Revealing Multipolar Nonlinear Scattering for Superlocalization of Silicon Nanostructures

Large-scale range diffraction grating displacement sensor based on polarization phase-shifting

Nanoscale Displacement Sensing Based on the Interaction of a Gaussian Beam with Dielectric Nano-Dimer Antennas.

Integrated dual-channel sensing utilizing polarized dissimilation based on photonic spin-orbit interaction.

Simultaneously Detecting Transversal and Longitudinal Displacement with the Dielectric Metasurface

High-resolution compact displacement sensor based on anisotropic feedback of microchip Nd: YAG lasers

Self-mixing Interferometry Based on Nanometer Fringes and Polarization Flipping

Anapole states and transverse displacement sensing based on the interaction between cylindrical vector beams and Au core-Si shell nanodisks

Directional Control of the Off-Normal Scattering from a Single Nanodisk by Superposed Linearly and Radially Polarized Beams.

Broadband Electromagnetic Dipole Resonance by the Coupling Effect of Multiple Dielectric Nanocylinders