Anapole states and transverse displacement sensing based on the interaction between cylindrical vector beams and Au core-Si shell nanodisks

Zhaokun Zhang,Zhihong Zhu

DOI: https://doi.org/10.1364/oe.530904

IF: 3.8

2024-07-20

Optics Express

Abstract:Zhaokun Zhang, Zhihong Zhu Precise optical control at the nanoscale is crucial for advancing photonic devices and sensing technologies. Herein, we theoretically ... [Opt. Express 32, 27999-28011 (2024)]

optics

What problem does this paper attempt to address?

Axial nano-displacement measurement with high resolution and wide range based on asymmetrical illumination.

Shuai Li,Cuifang Kuang,Jianhong Ge,Xu Liu

DOI: https://doi.org/10.1364/OE.21.007528

IF: 3.8

2013-01-01

Optics Express

Abstract:We propose a novel axial nano-displacement measuring approach. Based on asymmetrical illumination, the axial drifts of the sample plane can be measured by detecting the position of the centroid of the focal spot. Both CCD and QD are used as the detector in the system and two data processing models are designed. With a relatively simple and applicable configuration, the proposed system can realize a wide measuring range of > 4 lambda and a high axial resolution of 2nm. Moreover, the presented approach is immune to the influence caused by the energy fluctuation of the laser source. Possessing these advantages, this measuring method has big potential to be applied in modern engineering and scientific researches. (c) 2013 Optical Society of America
Axial Nanodisplacement Measurement Based on Astigmatism Effect of Crossed Cylindrical Lenses.

Long Li,Cuifang Kuang,Ding Luo,Xu Liu

DOI: https://doi.org/10.1364/ao.51.002379

IF: 1.9

2012-01-01

Applied Optics

Abstract:Spot distortion caused by astigmatism effect in orthogonal cylindrical lenses is utilized to measure axial displacement with 30 nm resolution, strong noise immunity, and compact experiment setup. Axial displacement of the sample surface is determined by four-quadrant difference processing of distorted laser spots' energy distribution images received by CCD. Four-quadrant difference processing results indicate an applicable measuring range of 5.6 μm (cubic fitting r=0.9988) with a highly linear range of 1.2 μm (linear fitting r=0.9996). Factors affecting measuring range and sensitivity are analyzed by theoretical deduction and numerical simulation. This technique has potential applications in drifting sample tracking and measurement in advanced microscopy.
Nano-Displacement Measurement Based On Virtual Pinhole Confocal Method

Long Li,Cuifang Kuang,Yi Xue,Xu Liu

DOI: https://doi.org/10.1088/0957-0233/24/3/035003

IF: 2.398

2013-01-01

Measurement Science and Technology

Abstract:A virtual pinhole confocal system based on charge-coupled device (CCD) detection and image processing techniques is built to measure axial displacement with 10 nm resolution, preeminent flexibility and excellent robustness when facing spot drifting. Axial displacement of the sample surface is determined by capturing the confocal laser spot using a CCD detector and quantifying the energy collected by programmable virtual pinholes. Experiments indicate an applicable measuring range of 1000 nm (Gaussian fitting r = 0.9902) with a highly linear range of 500 nm (linear fitting r = 0.9993). A concentric subtraction algorithm is introduced to further enhance resolution. Factors affecting measuring precision, sensitivity and signal-to-noise ratio are discussed using theoretical deductions and diffraction simulations. The virtual pinhole technique has promising applications in surface profiling and confocal imaging applications which require easily-customizable pinhole configurations.
Axial nanodisplacement measurement based on the double-helix point spread function generated using radially polarized beams with vortex phase modulation

li xue,cuifang kuang,yue fang,shangting you,ye ma,xu liu

DOI: https://doi.org/10.7567/JJAP.54.082501

IF: 1.5

2015-01-01

Japanese Journal of Applied Physics

Abstract:We propose a novel method of generating a double-helix point spread function(DH-PSF) by focusing one vortex-phase-modulated, radially polarized, and annular Gaussian beam. The DH-PSF has two prominent lobes that rotate around the optical axis along the propagation direction of the light beam, which can be applied in displacement measurement with high resolution. Results of simulation based on the vectorial diffraction theory show that the displacement measurement method using the DH-PSF generated by the proposed method can achieve linearity with a correlation coefficient of 0.9999, a sensitivity of 51.837 degrees/mu m, and a measurement range of 3 mu m. Further increase in displacement measurement precision can be achieved by introducing a special layer that is photosensitive only to the longitudinal component of the electric field. (C) 2015 The Japan Society of Applied Physics
An Axial Displacement Measurement Relying on the Double-Helix Light Beam

Yitian Hu,Shuai Li,Cuifang Kuang,Peng Xiu,Jianhong Ge,Xu Liu

DOI: https://doi.org/10.1016/j.optlastec.2013.12.006

2014-01-01

Abstract:A novel method of axial displacement measurement based on the double-helix (DH) beam is proposed in this paper. The DH point spread function (DH-PSF) with two prominent lobes which consist of optical beam modes superposing with each other in the Gauss–Laguerre (GL) modal plane has the characteristic that the two lobes can rotate like a binary star about the center of each other in the propagation of the light beam. We figure out the axial displacement with the variation of the rotated angle of the connection line of the two lobes. In this method, a CCD and a phase-only spatial light modulator (SLM) are used in a relatively reliable and simple experimental configuration, with which we can manage to realize high axial measuring resolution. One superb advantage is that the system is immune to the energy fluctuations of the laser source. As a result, the axial displacement measurement has a remarkable application prospect in modern engineering and scientific researches.
Magnetic transverse unidirectional scattering and longitudinal displacement sensing in silicon nanodimer

Zhaokun Zhang,Jipeng Xu,Ken Liu,Zhihong Zhu

DOI: https://doi.org/10.1364/oe.521725

IF: 3.8

2024-05-11

Optics Express

Abstract:Zhaokun Zhang, Jipeng Xu, Ken Liu, Zhihong Zhu Unidirectional scattering, crucial for manipulating light at the nanoscale, has wide-ranging applications from optical manipulation to ... [Opt. Express 32, 19279-19293 (2024)]

optics
An ultracompact high-resolution displacement sensor based on self-interference effect of single optical nanograting

Jie Qi,Chenguang Xin

DOI: https://doi.org/10.1117/12.2600368

2021-01-01

Abstract:Benefitting from properties including high sensitivity, high resolution, immunity to electromagnetic interference and remote sensing ability, optical-grating-based displacement measuring technologies have been widely used in many fields such as semiconductor manufacturing, precision machining, microscopic techniques and photolithography recently. In this work, high-resolution displacement measuring is demonstrated with an ultracompact structure consist of only a few optical components by using self-interference effect of a single nanograting. The resolution is demonstrated to be as low as 0.1-nm level. This method shows great potential in developing miniaturized high-resolution displacement devices and systems, which are highly demanded for future integrated high-precision machinery manufacturing systems.
Two-dimensional Displacement Sensors with Angstrom-Scale Resolution Based on Optical Slot Antenna Arrays

Axin He,Baowei Gao,Yi Xu,Tongzhou Zhang,Jiasen Zhang

DOI: https://doi.org/10.1063/5.0084400

IF: 5.6

2022-01-01

APL Photonics

Abstract:Optical displacement sensing with high resolution and noncontact detection plays an important role in nanometrology, nanofabrication, and super-resolution microscopy. However, displacement sensing along an arbitrary direction in a two-dimensional (2D) plane with angstrom-level precision remains challenging. Here, we propose a 2D displacement sensor composed of eight optical slot antennas. A tightly focused laser beam is illuminated upon the antennas. The amplitudes and phases of the output radiation of the antennas are controlled by geometries. The intensity distribution of the output far-field radiation, which strongly depends on the relative position between the focal spot of the incident light and the antennas, was used to retrieve the 2D coordinates of any location in a plane. A resolution as high as 0.88 nm was obtained. We also show a method for improving displacement sensitivity by designing the destructive interference among the radiation of the antennas. The angstrom-scale resolution and arbitrary point localization, along with the nanoscale size, pave the way for the development of high-performance sensing, integrated photonic circuits, and on-chip signal processing.
Plasmonic Focusing of a High-Order Cylindrical Vector Beam for On-Chip Detection

Hao Wang,Jinzhan Zhong,Xinrui Lei,Qiwen Zhan

DOI: https://doi.org/10.3390/photonics11060579

IF: 2.536

2024-06-20

Photonics

Abstract:We investigate the interaction between cylindrical vector beams (CVBs) and metallic annular structures. The mechanisms for plasmonic focusing and field distributions are studied both analytically and numerically. We demonstrate that the focusing patterns are locked with the order of CVBs due to the polarization selectivity for the excitation of plasmonic fields, which can be employed as a simplified yet efficient means of characterizing and detecting CVBs. The robustness of the focusing pattern is analyzed as a deviation between the centers of the CVBs and nanoring is introduced, providing a quantitative indicator of the relationship between the maximum deviation value and the focusing patterns. Our research contributes to a deeper understanding of interactions between CVBs and nanostructures, paving the way for novel applications in light detection and optical imaging.

optics
High-resolution compact displacement sensor based on anisotropic feedback of microchip Nd: YAG lasers

Yidong Tan,Shulian Zhang

DOI: https://doi.org/10.1117/12.810598

2009-01-01

Abstract:A simple and effective displacement sensor based on external anisotropic feedback in Nd:YAG lasers has been presented and demonstrated. When the system operates in anisotropic feedback induced by placing a birefringence element with phase difference about 45 degree(such as a wave plate) in the external cavity, both the laser intensities in two orthogonal directions are sinusoidal-modulated by the external reflector with a period of half wavelength displacement, but with a phase difference about 90 degree between them. When threshold intensity is introduced, a period of intensity fringe can be divided into four equal zones. Each zone corresponds to lambda/8 displacement of the external feedback reflector. According to the appearing sequence of the four states, the movement direction of external reflector can be discriminated. Thus, a novel displacement sensor with a resolution of up to 133 nm, as well as a function of direction discrimination, is believed to be achieved. The chief advantages of this sensor are that it is compact, small size, flexible, low cost, and robust. Most importantly, this sensor has a great potential to be improved in resolution by electric subdivision methods applied in the grating encoders. Experimental results have shown that the uncertainty (3 sigma) of displacement measurement is 0.2 mu m in a 7mm range, and the linearity is better than 2.57 x 10(-5).
High-precision Microdisplacement Sensor Based on Zeroth-Order Diffraction Using a Single-Layer Optical Grating.

Hongbo Zhao,Mengwei Li,Rui Zhang,Zhibin Wang,Kunyang Xie,Chenguang Xin,Li Jin,Zhouxin Liang

DOI: https://doi.org/10.1364/ao.59.000016

IF: 1.9

2019-01-01

Applied Optics

Abstract:A high-precision microdisplacement sensor based on zeroth-order diffraction of a single-layer optical grating is reported. Laser grating interference occurs when part of the laser is reflected diffraction by the grating and another part is vertically reflected back by a mirror and diffracted again by the grating, thus generating optical interferometric detection. For the purpose of obtaining the optimal contrast of the optical interferometric detection, the duty cycle of the grating and the orders of diffraction were optimized by the diffraction scalar theory. The microdisplacement sensor demonstrates a sensitivity of 0.40%/nm, a resolution of 0.6 nm, and a full-scale range of up to 100 µm. This work enables a high-performance displacement sensor, and provides a theoretical and technical basis for the design of a displacement sensor with an ultracompact structure.
Nanometer-scale Displacement Sensor Based on Phase-Sensitive Diffraction Grating.

Shuangshuang Zhao,Changlun Hou,Jian Bai,Guoguang Yang,Feng Tian

DOI: https://doi.org/10.1364/ao.50.001413

IF: 1.9

2011-01-01

Applied Optics

Abstract:In this paper, a nanometer-scale displacement sensor based on a phase-sensitive diffraction grating with interferometeric detection is described and experimentally demonstrated. The proposed displacement sensor consists of a coherent light source, a microstepping motor controller, an integrated grating, a mirror, and a differential circuit. Experimental results show that the displacement sensor has a sensitivity of about 6 mV/nm and a resolution of less than 1 nm. This displacement measurement is an attractive technology with high sensitivity, broad dynamic range, good reliability, and immunity to electromagnetic interference.
Cylindrical Vector Beam Revealing Multipolar Nonlinear Scattering for Superlocalization of Silicon Nanostructures

Bin Wang,Ying Che,Xiangchao Zhong,Wen Yan,Tianyue Zhang,Kai Chen,Yi Xu,Xiaoxuan Xu,Xiangping Li

DOI: https://doi.org/10.1364/prj.419300

IF: 7.6

2021-01-01

Photonics Research

Abstract:The resonant optical excitation of dielectric nanostructures offers unique opportunities for developing remarkable nanophotonic devices. Light that is structured by tailoring the vectorial characteristics of the light beam provides an additional degree of freedom in achieving flexible control of multipolar resonances at the nanoscale. Here, we investigate the nonlinear scattering of subwavelength silicon (Si) nanostructures with radially and azimuthally polarized cylindrical vector beams to show a strong dependence of the photothermal nonlinearity on the polarization state of the applied light. The resonant magnetic dipole, selectively excited by an azimuthally polarized beam, enables enhanced photothermal nonlinearity, thereby inducing large scattering saturation. In contrast, radially polarized beam illumination shows no observable nonlinearity owing to off-resonance excitation. Numerical analysis reveals a difference of more than 2 orders of magnitude in photothermal nonlinearity under two types of polarization excitations. Nonlinear scattering and the unique doughnut-shaped focal spot generated by the azimuthally polarized beam are demonstrated as enabling far-field high-resolution localization of nanostructured Si with an accuracy approaching 50 nm. Our study extends the horizons of active Si photonics and holds great potential for label-free superresolution imaging of Si nanostructures.
Displacement Detection Decoupling in Counter-Propagating Dual-Beams Optical Tweezers with Large-Sized Particle

Xunmin Zhu,Nan Li,Jianyu Yang,Xingfan Chen,Huizhu Hu

DOI: https://doi.org/10.3390/s20174916

IF: 3.9

2020-01-01

Sensors

Abstract:As a kind of ultra-sensitive acceleration sensing platform, optical tweezers show a minimum measurable value inversely proportional to the square of the diameter of the levitated spherical particle. However, with increasing diameter, the coupling of the displacement measurement between the axes becomes noticeable. This paper analyzes the source of coupling in a forward-scattering far-field detection regime and proposes a novel method of suppression. We theoretically and experimentally demonstrated that when three variable irises are added into the detection optics without changing other parts of optical structures, the decoupling of triaxial displacement signals mixed with each other show significant improvement. A coupling detection ratio reduction of 49.1 dB and 22.9 dB was realized in radial and axial directions, respectively, which is principally in accord with the simulations. This low-cost and robust approach makes it possible to accurately measure three-dimensional mechanical quantities simultaneously and may be helpful to actively cool the particle motion in optical tweezers even to the quantum ground state in the future.
Two-dimensional optical micro displacement sensing and crosstalk elimination based on the self-imaging effect of a grating pair

Xuhu Wang,Chi Wang,Lailai Qian,Youze Xin,Congzhen Hu,Li Jin,Mengwei Li,Li Geng,Bing Zhang

DOI: https://doi.org/10.1364/oe.537919

IF: 3.8

2024-10-10

Optics Express

Abstract:Xuhu Wang, Chi Wang, Lailai Qian, Youze Xin, Congzhen Hu, Li Jin, Mengwei Li, Li Geng, Bing Zhang This paper proposes a straightforward method for measuring micro-displacement synchronously along two orthogonal axes. A single structure ... [Opt. Express 32, 38679-38689 (2024)]

optics
An Ultra-Compact Angstrom-Scale Displacement Sensor with Large Measurement Range Based on Wavelength Modulation

Yi Xu,Baowei Gao,Axin He,Tongzhou Zhang,Jiasen Zhang

DOI: https://doi.org/10.1515/nanoph-2021-0754

2022-01-01

Abstract:Optical displacement metrology is important in nanotechnology and used to identify positions and displacements of nanodevices. Although several methods have been proposed, a sensor with ultracompact size, angstrom-scale resolution, and large measurement range is still lacking. We propose an optical displacement sensor with wavelength modulation that can demonstrate subwavelength footprint and angstrom-level resolution with large measurement range in this study. The proposed sensor consists of two optical slot antennas. Surface plasmon polaritons (SPPs) are launched at antennas and interfere when a tightly focused broadband light source illuminates the sensor. Spectrum of output SPPs presents a dip, which depends on the position of focal spot of incident light and is used to extract displacement. A maximum resolution of 0.734 nm was obtained. Furthermore, we used interference fringe of two broadband beams as light source and the measurement range of the sensor is not limited by the size of the tightly focused light source while maintaining high resolution. The method utilizes a new mechanism of wavelength modulation to overcome the trade-off between the high resolution and large measurement range, and achieve a variety of potential applications for nanometrology in the future.
Directional Imbalance of Bloch Surface Waves for Ultrasensitive Displacement Metrology

Ruxue Wang,Xinrui Lei,Yi Jin,Xiaolei Wen,Luping Du,Aimin Wu,Anatoly Zayats,Xiaocong Yuan

DOI: https://doi.org/10.1039/d1nr01251g

IF: 6.7

2021-01-01

Nanoscale

Abstract:Precise position sensing and nanoscale optical rulers are important in many applications in nanometrology, gravitational wave detection and quantum technologies. Several implementations of such nanoscale displacement sensors have been recently developed based on interferometers, nanoantennas, optical field singularities and optical skyrmions. Here, we propose a method for ultrasensitive displacement measurements based on the directional imbalance of the excitation of Bloch surface waves by an asymmetric double slit, which have low propagation loss and provide high detected intensity. The directionality of excitation changes dramatically with a sub-nanometric displacement of the illuminating Gaussian beam across the slit and can be used for displacement and refractive index metrology. We demonstrate a theoretical intensity ratio of the BSW excitation in opposite directions exceeding 890, which provides a displacement sensitivity of up to 2.888 nm-1 with a resolution below 0.5 nm over a 100 nm linearity range. Experimentally, a directional intensity ratio more than 90 has been achieved, with a displacement sensitivity of 0.122 nm-1 over a 300 nm linearity range, resulting in a resolution below 8 nm for a 600 nm illumination wavelength. The proposed facile configuration may have potential applications in nanometrology and super-resolution microscopy.
A Displacement Sensor Combining Cavity Tuning of A Laser with A Piezoelectric Transducer'S Subdivision Technique for A Bidirectional Sampling on the Rising and Falling Flanks

Zhengqi Zhao,Shulian Zhang,Song Zhang,Yidong Tan,Yan Li

DOI: https://doi.org/10.1063/1.3658200

2011-01-01

Abstract:A displacement sensor combining cavity tuning of a laser with a piezoelectric transducer's subdivision technique is presented. Because of the low gain, the measuring range of the displacement sensor based on the orthogonally polarized dual-frequency He-Ne laser at 633 nm is limited. The gain coefficient is proportional to the cube of the wavelength, so the He-Ne laser at 1.15 μm is adopted in research. A subdivision technique using a piezoelectric transducer enhances the resolution and the bidirectional sampling of the actuated voltage on its rising and falling flanks effectively amends the hysteresis and nonlinearity effect. The displacement sensor achieves the resolution of 10 nm in the range of 100 mm.
An absolute displacement sensor based on SNAP microresonator and similarity matching method

Yongchao Dong,Jiebo Wang,Yongkang Li,Nian Cai,Han Wang

DOI: https://doi.org/10.1109/jsen.2024.3366885

IF: 4.3

2024-01-01

IEEE Sensors Journal

Abstract:We propose and demonstrate an absolute displacement sensor based on a surface nanoscale axial photonics (SNAP) microresonator and similarity matching method. To obtain a direct readout of the absolute displacement from the spectrum, we calculate the correlation coefficient between the detected spectrum and the spectrum in the reference spectrum library. The feasibility of this method is first verified by simulation, and further, the influence of signal-to-noise ratio (SNR), sampling points, coupling parameters, and resonant wavelengths on displacement sensing accuracy is studied. Simulation results show that this method is highly resistant to noise interference and low sampling points. Importantly, we experimentally implemented SNAP’s absolute displacement sensing with an error of $\pm 2 \mu \text{m}$ after optimizing the reference library. This work lays the foundation for the development of high-performance probe absolute position sensors based on the whispering gallery mode (WGM) resonators.

engineering, electrical & electronic,instruments & instrumentation,physics, applied
Transverse Scattering from Nanodimers Tunable with Generalized Cylindrical Vector Beams

Chenhui Li,Xu Ouyang,Jialin Sun,Yaoyu Cao,Yi Xu,Yuri Kivshar,Xiangping Li

DOI: https://doi.org/10.1002/lpor.202200867

2023-01-01

Laser & Photonics Review

Abstract:Achieving directional control of optical antennas is critically important for the design of flexible interconnects between free‐space optics and on‐chip photonic circuitry. Here, a new concept of tunable transverse scattering of light from dielectric nanodimer antennas is suggested theoretically and demonstrated experimentally based on a selective excitation of the specific electromagnetic multipoles with the simultaneous suppression of both forward and backward scatterings. Importantly, it is revealed that the direction of the transverse scattering from nanodimers can be steered actively by varying the vectorial properties of the generalized cylindrical beams, and this new functionality in the experiment is demonstrated.

Anapole states and transverse displacement sensing based on the interaction between cylindrical vector beams and Au core-Si shell nanodisks

Axial nano-displacement measurement with high resolution and wide range based on asymmetrical illumination.

Axial Nanodisplacement Measurement Based on Astigmatism Effect of Crossed Cylindrical Lenses.

Nano-Displacement Measurement Based On Virtual Pinhole Confocal Method

Axial nanodisplacement measurement based on the double-helix point spread function generated using radially polarized beams with vortex phase modulation

An Axial Displacement Measurement Relying on the Double-Helix Light Beam

Magnetic transverse unidirectional scattering and longitudinal displacement sensing in silicon nanodimer

An ultracompact high-resolution displacement sensor based on self-interference effect of single optical nanograting

Two-dimensional Displacement Sensors with Angstrom-Scale Resolution Based on Optical Slot Antenna Arrays

Plasmonic Focusing of a High-Order Cylindrical Vector Beam for On-Chip Detection

High-resolution compact displacement sensor based on anisotropic feedback of microchip Nd: YAG lasers

High-precision Microdisplacement Sensor Based on Zeroth-Order Diffraction Using a Single-Layer Optical Grating.

Nanometer-scale Displacement Sensor Based on Phase-Sensitive Diffraction Grating.

Cylindrical Vector Beam Revealing Multipolar Nonlinear Scattering for Superlocalization of Silicon Nanostructures

Displacement Detection Decoupling in Counter-Propagating Dual-Beams Optical Tweezers with Large-Sized Particle

Two-dimensional optical micro displacement sensing and crosstalk elimination based on the self-imaging effect of a grating pair

An Ultra-Compact Angstrom-Scale Displacement Sensor with Large Measurement Range Based on Wavelength Modulation

Directional Imbalance of Bloch Surface Waves for Ultrasensitive Displacement Metrology

A Displacement Sensor Combining Cavity Tuning of A Laser with A Piezoelectric Transducer'S Subdivision Technique for A Bidirectional Sampling on the Rising and Falling Flanks

An absolute displacement sensor based on SNAP microresonator and similarity matching method

Transverse Scattering from Nanodimers Tunable with Generalized Cylindrical Vector Beams