Test patterns of multiple SIC vectors

LiangFeng,ZhangLuwen,LeiShaochong,ZhangGuohe,GaoKaile,LiangBin

2013-01-01

Abstract:This paper proposes a novel test pattern generator (TPG) for built-in self-test. Our method generates multiple single-input change (MSIC) vectors in a pattern, i.e., each vector applied to a scan c...

What problem does this paper attempt to address?

Test Patterns of Multiple Sic Vectors: Theory and Application in Bist Schemes

Feng Liang,Luwen Zhang,Shaochong Lei,Guohe Zhang,Kaile Gao,Bin Liang

DOI: https://doi.org/10.1109/tvlsi.2012.2195689

2013-01-01

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Abstract:This paper proposes a novel test pattern generator (TPG) for built-in self-test. Our method generates multiple singleinput change (MSIC) vectors in a pattern, i.e., each vector applied to a scan chain is an SIC vector. A reconfigurable Johnson counter and a scalable SIC counter are developed to generate a class of minimum transition sequences. The proposed TPG is flexible to both the test-per-clock and the test-per-scan schemes. A theory is also developed to represent and analyze the sequences and to extract a class of MSIC sequences. Analysis results show that the produced MSIC sequences have the favorable features of uniform distribution and low input transition density. The performances of the designed TPGs and the circuits under test with 45 nm are evaluated. Simulation results with ISCAS benchmarks demonstrate that MSIC can save test power and impose no more than 7.5% overhead for a scan design. It also achieves the target fault coverage without increasing the test length.
A Low Power Test Pattern Generation Method

Guohe ZHANG,Lili JI,Linlin ZHANG,Shaochong LEI,Feng LIANG

DOI: https://doi.org/10.7652/xjtuxb201302008

2013-01-01

Abstract:A novel test pattern generation method for built-in-self-test (BIST) is proposed to solve the problems of power, hardware overhead and fault detection in VLSI test. The vectors generated by linear feedback shift register (LFSR) and single input change (SIC) counter are operated to generate multiple single-input change (MSIC) sequences. Then, a reconfigurable SIC counter and a test pattern generator are designed to verify the uniqueness of MSIC test patterns. Simulation results with ISCAS'89 benchmarks based on the nangate 45 nm process show that the MSIC-TPG circuits impose about 1%-3% power overhead of the CUTs'average working power. Comparisons with traditional pseudo random test patterns show that the test power decreases about 5.48%-66.86%, and that the test patterns generated by the proposed method have the advantages of uniqueness and minimum transitions.
A Low Power Test Pattern Generator for Bist

Shaochong Lei,Feng Liang,Zeye Liu,Xiaoying Wang,Zhen Wang

DOI: https://doi.org/10.1587/transele.e93.c.696

2010-01-01

IEICE Transactions on Electronics

Abstract:To tackle the increasing testing power during built-in self-test (BIST) operations, this paper proposes a new test pattern generator (TPG). With the proposed reconfigurable LFSR, the reconfigurable Johnson counter, the decompressor and the XOR gate network, the introduced TPG can produce the single input change (SIC) sequences with few repeated vectors. The proposed SIC sequences minimize switching activities of the circuit under test (CUT). Simulation results on ISCAS benchmarks demonstrate that the proposed method can effectively save test power, and does not impose high impact on test length and hardware for the scan based design.
Low Cost Test Pattern Generation in Scan-Based BIST Schemes

Guohe Zhang,Ye Yuan,Feng Liang,Sufen Wei,Cheng-Fu Yang

DOI: https://doi.org/10.3390/electronics8030314

IF: 2.9

2019-01-01

Electronics

Abstract:This paper proposes a low-cost test pattern generator for scan-based built-in self-test (BIST) schemes. Our method generates broadcast-based multiple single input change (BMSIC) vectors to fill more scan chains. The proposed algorithm, BMSIC-TPG, is based on our previous work multiple single-input change (MSIC)-TPG. The broadcast circuit expends MSIC vectors, so that the hardware overhead of the test pattern generation circuit is reduced. Simulation results with ISCAS'89 benchmarks and a comparison with the MSIC-TPG circuit show that the proposed BMSIC-TPG reduces the circuit hardware overhead about 50% with ensuring of low power consumption and high fault coverage.
A Low Cost Test Pattern Generator for Test-Per-clock BIST Scheme.

Shaochong Lei,Zhen Wang,Zeye Liu,Feng Liang

DOI: https://doi.org/10.1587/elex.7.672

2010-01-01

IEICE Electronics Express

Abstract:Test power and test overhead are crucial to VLSI and SOC testing. This paper proposes a low cost test pattern generator (TPG) for test-per-clock built-in self-test (BIST) scheme. The proposed method utilizes a two-dimensional TPG and a bit-XOR array to reduce area overhead, and generates single input change (SIC) sequences to reduce input transitions of the circuit under test (CUT). Simulation results on ISCAS benchmarks demonstrate that the proposed method can achieve high fault coverage and effectively reduce test power.
A Low Power Test Pattern Generation for Built-in Self-Test Based Circuits

Bo Ye,Tianwang Li,Qian Zhao,Duo Zhou,Xiaohua Wang,Min Luo

DOI: https://doi.org/10.1080/00207217.2010.538899

2011-01-01

International Journal of Electronics

Abstract:A low-power test pattern generation, named the low switching activity test pattern generation (LSA-TPG), is proposed to reduce the power dissipation of built-in self-test (BIST)-based circuits during test. A single input changing (SIC) test pattern is generated by a counter and a Gray encoder which is called the SICG (single input changing generator). The built-in test vectors are generated by the SIC patterns which are exclusive-ORed with seeds generated by the modified linear feedback shift register (LFSR). All the test vectors are SIC patterns during the 2m test clock period; thus the switching activities of the test vectors are greatly reduced in test mode without compromising fault coverage. The proposed structure has the advantages of low test power and low hardware overhead. LSA-TPG is independent of circuit under test (CUT) and flexible enough to be used in both BIST and scan-based BIST architectures. The proposed architecture increases the correlation among the test patterns with negligible impact on test length. Experiments conducted on ISCAS'89 benchmark circuits demonstrate that the proposed scheme gives better fault coverage with a large reduction in test power dissipation.
Multi-Gigabit Rate Pattern-Matching Engine Using Grouping CAM/TCAM

Yi-fan HE,Guo-yin XU,Hai-bin SHEN

DOI: https://doi.org/10.3969/j.issn.1005-9490.2007.01.042

2007-01-01

Abstract:In order to improve the performance of pattern-matching module in NIDS, an efficient engine for multi-gigabit rate, line-speed pattern-matching is proposed after analyzing a large amount of related work. By grouping and evenly storing patterns into CAM or TCAM according to their lengths and amount, as well as using payload-switching technique, this engine not only reaches multi-gigabit rate performance, but also has high storage efficiency. System performance can be improved further by using multiple process modules in parallel. In a 200 MHz Clock implementation, system throughput can reach more than 6 Gbit/s.
A Generation Method for Test Patterns with Low Power and Low Cost

Ye WANG,Feng LIANG,Dan YAN,Shaochong LEI

DOI: https://doi.org/10.7652/xjtuxb201712003

2017-01-01

Abstract:A test generation method with broadcast for built-in self-test (BIST) is proposed to solve problems of power consumption,hardware overhead and large test data volume in chip testing.The hardware implementation and test scheme of the method are given.Multiple singleinput change (MSIC) sequences are generated by an XOR network that combines a linear feedback shift register (LFSR) structure with a Johnson counter.Then,the broadcast circuit expands the MSIC sequences to broadcast-based multiple single input change (BMSIC) test patterns that are able to fill more scan chains,so that the hardware overhead of the test pattern generation circuit is reduced.Simulation results with ISCAS'89 benchmarks and a comparison with the MSIC test pattern generation circuit shows that the proposed BMSIC test method reduces the circuit hardware overhead about 50％ with ensuring of low power consumption and high fault coverage.
A Single Input Change Test Pattern Generator for Sequential Circuits

Feng Liang,ShaoChong Lei,ZhiBiao Shao

DOI: https://doi.org/10.1093/ietele/e91-c.8.1365

2008-01-01

IEICE Transactions on Electronics

Abstract:An optimized Built-In Self-Test technology is proposed in this paper. A simplified algebraic model is developed to represent the configurations of single input change circuits. A novel single input change sequence generation technique is designed. It consists of a modified scan shift register, a seed storage array and a series of XOR gates. This circuitry can automatically generate single input change sequences of more unique vectors. Experimental results based on the ISCAS-89 benchmark show that the proposed method can achieve high stuck-at fault coverage with low switching activity during test applications.
An Effective BIST Circuit for Barrel Shifter Within 8 Bits MCU

XU Xin-min,HONG Bo,SHANG Li-na,HE Le-nian

DOI: https://doi.org/10.3969/j.issn.1007-0249.2007.06.019

2007-01-01

Abstract:A novel deterministic built-in self-test(BIST) scheme for barrel shifter embedded in 8 bits MCU datapath is proposed,and the validation is also provided.With this scheme,5 D-type registers are required and 16 patterns are generated during 16 test clock cycles,while the fault testing coverage can reach 100%.This scheme is also fit for DFT for general 2N(N≥4) bits barrel shifter.
Test Pattern Generation in Built-In Self-Test with Multiple Scan Chains

Zhao-lin LI,Yi-Zheng YE,Zhi-gang MAO

DOI: https://doi.org/10.3321/j.issn:0254-4164.2001.04.013

2001-01-01

Jisuanji Xuebao/Chinese Journal of Computers

Abstract:Scan based built-in self-test (BIST), which naturally extends scan-based test methodology with test patterns applied from test equipment to BIST, can be used for the self test of sequential circuits and attain higher fault coverage. If the circuit under test (CUT) contains multiple parallel scan chains, a parallel generator is needed. Known as the common pseudo-random pattern generator (PRPG), an LFSR can be configured to generate a random pattern stream. The PRPG-based patterns may be applied to the existing scan architecture directly from the LFSR, or through some decorrelation logic. In order to attain higher fault coverage, it is very important to analyze the test pattern generation in the scan based BIST. The paper presents a kind of scheme for test pattern generation in the scan based BIST for the circuits with multiple scan chains. In the test pattern generation scheme the PRPG, which is implemented by an LFSR, shifts the sequences into all scan chains simultaneously. The correlativity weight R(M) of multiple scan chains is also defined in the paper. Based on the analysis of the different degree effect on fault coverage due to the different configuration of multiple scan chains, one conclusion is drawn that the probability that the fault coverage is reduced is increased with an increase of the correlativity weight R(M). If the circuit is tested by the multiple scan chains with the minimum R(M), the probability that the fault coverage is reduced is least. In the paper a method to construct multiple scan chains with minimum correlativity weight R(M) is proposed to overcome the bad effect on fault coverage due to the correlation between scan chains. Furthermore the minimum set of deterministic patterns is generated for hard-to-test faults by ATPG and the set is used to design the bit modifying logic circuit (BML), which is located between multiple scan chains and the CUT. Through BML the signals in multiple scan chains are controlled to input to the CUT. When the test control signal is low, the test patterns in multiple scan chains are input into the CUT directly. When the test control signal is high, the value of the signals at certain bit positions in the multiple scan chains are modified by BML and the changed test patterns are input into the CUT to test hard-to-test faults for complete fault coverage. The experiments on some ISCAS'89 benchmark circuits show that the complete fault coverage can be obtained by the test method presented by the paper. The overhead of BML is also analyzed.
A new low power test pattern generator based on two-bit twisted ring counter

Bin Zhou,Qun Wu,Liyi Xiao,Xinchun Wu,Bei Cao

DOI: https://doi.org/10.1109/AISMOT.2011.6159385

2011-01-01

Abstract:A new single input change (SIC) test pattern generator (TPG), called multi two-bit twisted ring counters (MTB-TRC), is presented in this paper. Experimental results based on ISCAS'85 benchmark circuits show that the proposed MTB-TRC has the improved performance (power, fault coverage and test length), compared with the corresponding already known TPGs. Another advantage of the proposed MTB-TRC is that the same TPG can be used for testing more than one module in a SOC. © 2011 IEEE.
A Unified Solution to Reduce Test Power and Test Volume for Test-per-scan Schemes

Shaochong Lei,Zhen Wang,Zeye Liu,Feng Liang

DOI: https://doi.org/10.1587/elex.7.1364

2010-01-01

IEICE Electronics Express

Abstract:This paper proposes a unified solution to reduce test power and test volume for test-per-scan schemes. With the self-testing using MISR and Parallel SRSG (STUMPS) architecture and the developed reconfigurable Johnson counter, the proposed test pattern generator (TPG) applies two transition sequences to all scan chains, and the primary inputs of the circuit under test (CUT) keep unchanged at most times. Therefore, the switching activities both in the combinational block and in scan chains can be reduced simultaneously. If the generated test vectors that do not contribute to fault coverage are filtered out, the remaining deterministic patterns show the favorable features of high compressible and low-test power. Simulation results on ISCAS'89 benchmarks demonstrate that the proposed TPG imposes negligible impact on test length and power overhead of the CUT.
A new low power test pattern generator using a variable-length ring counter

Bin Zhou,Yi-zheng Ye,Zhao-lin Li,Xin-chun Wu,Rui Ke

DOI: https://doi.org/10.1109/ISQED.2009.4810302

2009-01-01

Abstract:A new built-in self-test (BIST) test pattern generator (TPG) for low power testing is presented in this paper. The principle of the proposed approach is to reconfigure the CUT's partial-acting-inputs into a short ring counter (RC), and keep the CUT's partial-freezing-inputs unchanged during testing. Experimental results based on ISCAS'85 and ISCAS'89 benchmark circuits show that 17% reductions in the test data storage, 43% reductions in the number of test pattern, 30% reductions in the average power, 19% reductions in the average power and 46% reductions in the total power consumption are attained during testing with a small size decoding logic.
Generation of Low Power SSIC Sequences

Bei Cao,Yongsheng Wang

DOI: https://doi.org/10.1007/978-3-319-73447-7_32

2017-01-01

Abstract:Single input change (SIC) sequence for VLSI testing has been researched because of effectiveness to more test fault models and low power consumption testing. It is the high fault coverage in deterministic built-in self-test (BIST) with low test cost and short test application time. The sequential single input change (SSIC) sequence used in deterministic BIST is presented in this paper for decreasing the dynamic power, reducing test application time and increasing fault coverage. The selection of seed vectors is the significant technique in deterministic BIST. The critical features of SSIC sequence are proposed for selecting seed vectors. The SSIC sequence generator is designed. The simulation results using benchmark circuits show that the SSIC sequences can increase fault coverage and decrease application time than random SIC sequences. SSIC sequence also has low dynamic power consumption.
A Test Pattern Generation Method with High Compression Ratio

Feng Liang,Luwen Zhang,Shaochong Lei

DOI: https://doi.org/10.1587/elex.8.1842

2011-01-01

IEICE Electronics Express

Abstract:This paper proposes a test pattern generation and compression method to reduce test volume for VLSI testing. Unlike traditional approaches, the proposed scheme predefines linear relationships between vectors or within a vector of a test sequence firstly. Then, it determines test patterns by fault simulation. Therefore, patterns of a deterministic test set keep the predefined linear relationships, and can be highly compressed. Simulation results on ISCAS'89 benchmarks demonstrate that the proposed method can significantly reduce the data size with high fault coverage.
Test Pattern Generation Based On Multi-Trc Scan Architecture For Reducing Test Cost

Bin Zhou,Liyi Xiao,Yizheng Ye,Xin-chun Wu,Bei Cao

DOI: https://doi.org/10.1166/jolpe.2012.1167

2012-01-01

Journal of Low Power Electronics

Abstract:Continuous scan-based design is an effective approach of reducing test application time in a system-on-a-chip (SoC) test architecture. However, two problems that are becoming quite critical for conventional continuous scan-based testing are large test data storage and high test power consumption. In order to mitigate two problems, this paper proposed a multi-Twisted ring counter scan architecture (MTRC-SA) based on multiple clock disabling (MCD) technique. Our approach firstly partition inputs into several compatible sets (CS) with the same size and one incompatible set (ICS). Test patterns are then generated by configurating CS/ICS into a TRC. The TRCs corresponding to CSs are utilized to invert their previous states, and the TRC corresponding to ICS is utilized to compress test data corresponding to ICS by TRC compression algorithm. Experimental results for the International Symposium on Circuits and Systems (ISCAS) 89 benchmark circuits show that significant reduction on test storage, test application time and power dissipation can be achieved compared to the conventional scan method and MCD.
Low Power Deterministic Test Pattern Generator Based on Non-uniform Cellular Automata using Dynamical Extend Algorithm

曹贝,肖立伊,王永生

2009-01-01

Journal of Computer-Aided Design & Computer Graphics

Abstract:The test pattern generator(TPG) in deterministic BIST often suffered from problems during the synthesis,such as depending on redundant test patterns,and resulting in extra test power consumption and idle test cycles.An efficient algorithm was proposed to synthesize a built-in TPG from low power deterministic test patterns without inserting any redundancy test vectors.The structure of TPG was based on the non-uniform cellular automata(CA) and was used to test combinational circuits.The key idea of algorithm was to dynamically extend the neighborhood based on simulated annealing for finding the optimal non-uniform CA topology.Simulation results on benchmark combinational circuits showed that the proposed algorithm is efficient in synthesizing low power deterministic TPGs,with no effects on fault coverage and test time.
Low power deterministic BIST based on SDIC

Jianwei ZHANG,Qiuhong DING,Bin ZHOU,Fei TENG,Wanli MA,Zhengcao WANG,Xiaoming CHEN,Zhiyuan LI

DOI: https://doi.org/10.11918/j.issn.0367-6234.2016.11.015

2016-01-01

Abstract:In order to obtain low power consumption and high fault coverage, a new single?double input change deterministic test pattern generator is presented based on a single input change technology and 2-bit twisted ring counter. Firstly, unlike traditional deterministic test schemes storing the deterministic seeds, the presented scheme saves the control signal bits in ROM. With these bits, the deterministic seeds and patterns are generated by single?double input change. It is beneficial for power consumption and area overhead because the length of control signal bits are just about 1/2 of deterministic seed ’ s. Secondly, 2-bit down counter can reasonably filter redundant vector, and it greatly shorten test time and reduce overall energy consumption. At last, considering different needs, the test pattern compression algorithm and three kinds of x assignment algorithm are proposed. Experimental results show that the average power reductions are up to 42.36%,32.32%,38.94%,and the test length reductions are up to 77.6%,86.1%,84.3%, and then the test data storages are decreased by 79.4%,65.2%,68.1%, respectively.
Test pattern generation for static burn-in based on equivalent fault model

Cui Xiaole,Qian Zhengyu,Shi Xinming,Lee Chung-Len

DOI: https://doi.org/10.1109/EDSSC.2013.6628079

2013-01-01

Abstract:To speed up the deterioration of a circuit under test (CUT), an input pattern is needed to maximize its leakage power in the static burn-in process. This paper presents an efficient pattern generation method with ATPG approach. To reduce the effort of precise power calculation, a metric that is linearly related to the leakage power of CUT is proposed. This generation method reuses the test set for stuck-at faults, and it can search for the quasi-optimal target pattern in the collapsed pattern space by the equivalent fault model. © 2013 IEEE.

Test patterns of multiple SIC vectors

Test Patterns of Multiple Sic Vectors: Theory and Application in Bist Schemes

A Low Power Test Pattern Generation Method

A Low Power Test Pattern Generator for Bist

Low Cost Test Pattern Generation in Scan-Based BIST Schemes

A Low Cost Test Pattern Generator for Test-Per-clock BIST Scheme.

A Low Power Test Pattern Generation for Built-in Self-Test Based Circuits

Multi-Gigabit Rate Pattern-Matching Engine Using Grouping CAM/TCAM

A Generation Method for Test Patterns with Low Power and Low Cost

A Single Input Change Test Pattern Generator for Sequential Circuits

An Effective BIST Circuit for Barrel Shifter Within 8 Bits MCU

Test Pattern Generation in Built-In Self-Test with Multiple Scan Chains

A new low power test pattern generator based on two-bit twisted ring counter

A Unified Solution to Reduce Test Power and Test Volume for Test-per-scan Schemes

A new low power test pattern generator using a variable-length ring counter

Generation of Low Power SSIC Sequences

A Test Pattern Generation Method with High Compression Ratio

Test Pattern Generation Based On Multi-Trc Scan Architecture For Reducing Test Cost

Low Power Deterministic Test Pattern Generator Based on Non-uniform Cellular Automata using Dynamical Extend Algorithm

Low power deterministic BIST based on SDIC

Test pattern generation for static burn-in based on equivalent fault model