Abstract:The pivotal issue of reliability is one of colossal concern for circuit designers. The driving force is transistor aging, dependent on operating voltage and workload. At the design time, it is difficult to estimate close-to-the-edge guardbands that keep aging effects during the lifetime at bay. This is because the foundry does not share its calibrated physics-based models, comprised of highly confidential technology and material parameters. However, the unmonitored yet necessary overestimation of degradation amounts to a performance decline, which could be preventable. Furthermore, these physics-based models are exceptionally computationally complex. The costs of modeling millions of individual transistors at design time can be evidently exorbitant. We propose the revolutionizing prospect of a machine learning model trained to replicate the physics-based model, such that no confidential parameters are disclosed. This effectual workaround is fully accessible to circuit designers for the purposes of design optimization. We demonstrate the models' ability to generalize by training on data from one circuit and applying it successfully to a benchmark circuit. The mean relative error is as low as 1.7%, with a speedup of up to 20X. Circuit designers, for the first time ever, will have ease of access to a high-precision aging model, which is paramount for efficient designs. This work is a promising step in the direction of bridging the wide gulf between the foundry and circuit designers.

Circuit Reliability Comparison Between Stochastic Computing and Binary Computing.

Can Emerging Computing Paradigms Help Enhancing Reliability Towards the End of Technology Roadmap?

Design Guidelines of Stochastic Computing Based on FinFET: A Technology-Circuit Perspective

Design of Nano-Scale Noise Tolerant CMOS Logic Circuits Based on Probabilistic Markov Random Field Approach

Stochastic Computing for Sub-0.2V Applications-Technology Evaluation and Design Optimization

Towards Reliability-Aware Circuit Design in Nanoscale FinFET Technology: — New-generation Aging Model and Circuit Reliability Simulator

Aging-Aware Gate-Level Modeling for Circuit Reliability Analysis

Investigation on the Vdd Scaling Limit of Stochastic Computing Circuits Based on FinFET Technology

Concurrent device/circuit aging for general reliability simulations

Stochastic Synthesis for Stochastic Computing

Simultaneous Area and Latency Optimization for Stochastic Circuits by D Flip-Flop Insertion

Accelerating stochastic‐based reliability estimation for combinational circuits at RTL using GPU parallel computing

Statistical Reliability Analysis under Process Variation and Aging Effects

SCGen: A Versatile Generator Framework for Agile Design of Stochastic Circuits

From Multipliers to Integrators: A Survey of Stochastic Computing Primitives

Systematical Investigation of Flicker Noise in 14 nm FinFET Devices towards Stochastic Computing Application

A Parallel Bitstream Generator for Stochastic Computing

Circuit Reliability Evaluation of Approximate Computing

A stochastic computing architecture for iterative estimation

Variability- and Reliability-Aware Design for 16/14nm and Beyond Technology

Modeling and Predicting Transistor Aging under Workload Dependency using Machine Learning