X‐ray Imaging for Non‐Destructive Microstructure Analysis at SSRF

Rongchang Chen,Ping Liu,Tiqiao Xiao,Lisa X. Xu
DOI: https://doi.org/10.1002/adma.201402956
IF: 29.4
2014-01-01
Advanced Materials
Abstract:The X-ray imaging beamline at the Shanghai Synchrotron Radiation Facility is aimed at developing and evaluating the effectiveness of synchrotron radiation (SR)-based imaging techniques in planar or computed tomography modalities. Several X-ray imaging methods are in use and find extensive applications in many research fields. In this Essay, the status of the methodology development at the beamline is discussed and applications are reviewed.
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