Abstract:As global warming becomes increasingly serious, humans start to consider how to coexist with the natural environment. People become more and more aware of environmental protection and sustainable development. Therefore, in the pursuit of economic growth, it has become a consensus that enterprises should be responsible for the social and ecological environment. Regarding the manufacturing of electronic devices, as long as both component production quality and assembly quality are ensured, consumers can be provided with high-quality, safe, and efficient products. In light of this trend, enhancing product availability and reliability can reduce costs and carbon emissions resulting from repairing or replacing components, thus becoming a vital factor for corporate and environmental sustainability. Accordingly, enterprises enhance their economic benefits as well as have the effects of energy conservation and waste reduction by extending products' service lifetime and increasing their added value. According to several studies, it takes a long time to retrieve electronic products' lifetime data. Moreover, acquiring complete samples is often challenging. Consequently, when analyzing real cases, samples are usually collected using censoring techniques. The type-I right censoring data is suitable for industrial processes. Thus, this study utilized type-I right censoring sample data to estimate the lifetime performance index. It usually takes a large amount of time to access lifetime data for electronic products and it is often impossible to obtain complete samples since the size of the sample is usually small. Hence, to avoid misjudgment caused by sampling errors, this study followed suggestions from existing research and applied fuzzy tests built on confidence intervals to establish a fuzzy evaluation model for the lifetime performance index. This model helps relevant electronic industries not only evaluate the lifetime of their electronic components but also instantly seize opportunities for improvement.

Belief Reliability Evaluation with Limited Time-to-Failure Data under Uncertain Right Censoring

Combining Model Checking and Testing with an Application to Reliability Prediction and Distribution

Reliability estimation for bathtub-shaped distribution under block progressive censoring

Reliability inference for dual constant-stress accelerated life test with exponential distribution and progressively Type-II censoring

Reliability Assessment for Dual Constant‐Stress Accelerated Life Test Based on Weibull Distribution With Type‐II Censoring

Efficient Bayesian Inference for a Defect Rate Based on Completely Censored Data

Reliability estimation for one-shot devices under cyclic accelerated life-testing

Inference for constant-stress Weibull competing risks model under generalized progressive hybrid censoring

Reliability estimation for Kumaraswamy distribution under block progressive type-II censoring

Regression Analysis of Right-Censored Failure Time Data with Missing Censoring Indicators

Estimation and Confidence Bands of A Conditional Survival Function with Censoring Indicators Missing at Random

Inference on exponentiated Rayleigh distribution with constant stress partially accelerated life tests under progressive type-II censoring

Reliability estimation and statistical inference under joint progressively Type-II right-censored sampling for certain lifetime distributions

Fuzzy Evaluation Model for Lifetime Performance Using Type-I Censoring Data

Estimation and prediction for the Rayleigh distribution based on double Type-I hybrid censored data

Inference on Weibull inverted exponential distribution under progressive first-failure censoring with constant-stress partially accelerated life test

Nonparametric Bayesian reliability analysis of masked data with dependent competing risks

Uncertainty theory as a basis for belief reliability

Modelling and estimation of system reliability under dynamic operating environments and lifetime ordering constraints

Flexible Bayesian reliability demonstration testing

A Model for Censored Reliability Data with Two Dependent Failure Modes and Prediction of Future Failures