Ultrafast MeV electron diffraction/microscopy at SLAC (Conference Presentation)

Xiaozhe Shen,Renkai Li,Jie Yang,Stephen P Weatherspy,Xijie Wang
DOI: https://doi.org/10.1117/12.2271150
2017-01-01
Abstract:SLAC recently launched the ultrafast electron diffraction and microscopy (UED/UEM) Initiative, with the goal to develop the world’s leading ultrafast electron scattering instruments, which are complementary with x-ray free-electron lasers such as LCLS and LCLS-II. The first step of the Initiative is a MeV UED system which is now actively supporting an ultrafast science program, and at the same time serving as a testbed for instrumentation development. In this talk, design of the SLAC MeV UED system will be briefly introduced. Key machine performance parameters will be reviewed, including machine stability and reproducibility, as well as reciprocal-space and temporal resolution. Ultrafast dynamics from a variety of samples, including 2D materials, thin nanofilms, nanoparticles, and gas-phase molecules have been studied using this machine. Selected ultrafast science experiment results will be presented. In the …
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