Machine Learning for Noise Sensor Placement and Full-Chip Voltage Emergency Detection

Xiaochen Liu,Shupeng Sun,Xin Li,Haifeng Qian,Pingqiang Zhou
DOI: https://doi.org/10.1109/tcad.2016.2611502
IF: 2.9
2016-01-01
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Abstract:Power supply fluctuation can be potential threat to the correct operations of processors, in the form of voltage emergency that happens when supply voltage drops below a certain threshold. Noise sensors (with either analog or digital outputs) can be placed in the nonfunction area of processors to detect voltage emergencies by monitoring the runtime voltage fluctuations. Our work addresses two impo...
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