Exploring Polarization Rotation Instabilities in Super‐Tetragonal BiFeO3 Epitaxial Thin Films and Their Technological Implications
Ye Cao,Shuzhen Yang,Stephen Jesse,Ivan Kravchenko,Pu Yu,Long-Qing Chen,Sergei V. Kalinin,Nina Balke,Qian Li
DOI: https://doi.org/10.1002/aelm.201600307
IF: 6.2
2016-01-01
Advanced Electronic Materials
Abstract:Advanced Electronic MaterialsVolume 2, Issue 12 1600307 Communication Exploring Polarization Rotation Instabilities in Super-Tetragonal BiFeO3 Epitaxial Thin Films and Their Technological Implications Ye Cao, Ye Cao Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831 USASearch for more papers by this authorShuzhen Yang, Shuzhen Yang State Key Laboratory for Low-Dimensional Quantum Physics, Department of Physics and Collaborative Innovation Center for Quantum Matter, Tsinghua University, Beijing, 100084 China RIKEN Center for Emergent Matter Science (CEMS), Wako, Saitama, 351-0198 JapanSearch for more papers by this authorStephen Jesse, Stephen Jesse Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831 USASearch for more papers by this authorIvan Kravchenko, Ivan Kravchenko Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831 USASearch for more papers by this authorPu Yu, Pu Yu State Key Laboratory for Low-Dimensional Quantum Physics, Department of Physics and Collaborative Innovation Center for Quantum Matter, Tsinghua University, Beijing, 100084 China RIKEN Center for Emergent Matter Science (CEMS), Wako, Saitama, 351-0198 JapanSearch for more papers by this authorLong-Qing Chen, Long-Qing Chen Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, 16802 USASearch for more papers by this authorSergei V. Kalinin, Sergei V. Kalinin Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831 USASearch for more papers by this authorNina Balke, Corresponding Author Nina Balke balken@ornl.gov Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831 USAE-mail: balken@ornl.gov, liq1@ornl.govSearch for more papers by this authorQian Li, Corresponding Author Qian Li liq1@ornl.gov Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831 USAE-mail: balken@ornl.gov, liq1@ornl.govSearch for more papers by this author Ye Cao, Ye Cao Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831 USASearch for more papers by this authorShuzhen Yang, Shuzhen Yang State Key Laboratory for Low-Dimensional Quantum Physics, Department of Physics and Collaborative Innovation Center for Quantum Matter, Tsinghua University, Beijing, 100084 China RIKEN Center for Emergent Matter Science (CEMS), Wako, Saitama, 351-0198 JapanSearch for more papers by this authorStephen Jesse, Stephen Jesse Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831 USASearch for more papers by this authorIvan Kravchenko, Ivan Kravchenko Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831 USASearch for more papers by this authorPu Yu, Pu Yu State Key Laboratory for Low-Dimensional Quantum Physics, Department of Physics and Collaborative Innovation Center for Quantum Matter, Tsinghua University, Beijing, 100084 China RIKEN Center for Emergent Matter Science (CEMS), Wako, Saitama, 351-0198 JapanSearch for more papers by this authorLong-Qing Chen, Long-Qing Chen Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, 16802 USASearch for more papers by this authorSergei V. Kalinin, Sergei V. Kalinin Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831 USASearch for more papers by this authorNina Balke, Corresponding Author Nina Balke balken@ornl.gov Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831 USAE-mail: balken@ornl.gov, liq1@ornl.govSearch for more papers by this authorQian Li, Corresponding Author Qian Li liq1@ornl.gov Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831 USAE-mail: balken@ornl.gov, liq1@ornl.govSearch for more papers by this author First published: 22 November 2016 https://doi.org/10.1002/aelm.201600307Citations: 9Read the full textAboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat Graphical Abstract A strategy for addressing tetragonal/rhombohedral phase transition dynamics in super-tetragonal BiFeO3 thin films under multiple coupled excitations (e.g., local tip pressure and electric field) is presented. A further design of coplanar-capacitor devices allows examination and global control of these phase instabilities, opening a new pathway for manipulating a multitude of functionalities of BiFeO3 such as elastic stiffness and piezoresponse. Citing Literature Supporting Information As a service to our authors and readers, this journal provides supporting information supplied by the authors. Such materials are peer reviewed and may be re-organized for online delivery, but are not copy-edited or typeset. Technical support issues arising from supporting information (other than missing files) should be addressed to the authors. Filename Description aelm201600307-sup-0001-S1.pdf830 KB Supplementary Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article. Volume2, Issue12December 20161600307 RelatedInformation