Novel Spurious Suppression Technique for W-CDMA Duplexer Using SiO 2 / Al / LiNbO 3 Structure

Hiroyuki Nakamura,Hidekazu Nakanishi,Tetsuya Tsurunari,Ken Matsunami,Yukio Iwasaki,Ken-ya Hashimoto,Masatsune Yamaguchi
2008-01-01
Abstract:This paper describes the novel spurious suppression technique for SiO2/Al/LiNbO3 structure. Regarding the Rayleigh-mode spurious, it can be suppressed by controlling the cross-sectional shape of a SiO2 overlay deposited on resonator electrodes. Regarding the transverse -mode spurious, it can be suppressed by selectively removing the SiO2 overlay from the dummy electrode region for enhancing the SAW energy confinement in the active electrode region. We applied the proposed technique to the development of a miniature W-CDMA duplexer on a 5o Y-X LiNbO3 substrate. The developed SAW duplexer was installed into a 2.5 mm×2.0 mm package, and exhibited low insertion loss, high out-of-band rejection and small TCF. The insertion losses in the Tx and Rx bands are 1.2dB and 1.9dB, respectively, the isolations are 53 dB in Rx band and 45 dB in Tx band, and the TCF is about -30 ppm/oC, respectively.
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