Molecular Dynamics Simulation of Swift Heavy Ion Irradiation Effects on Amorphous Nano-SiO 2 Film

Dongdong Zhao,Hongxia Liu,Shulong Wang
DOI: https://doi.org/10.5013/ijssst.a.16.02.11
2020-01-01
International Journal of Simulation Systems Science & Technology
Abstract:The damage production induced by swift heavy ion irradiation in amorphous nano-SiO2 is investigated by molecular dynamics method. By given energy to a cylindrical region, the central nanoholes can be produced, which depends on the electronic energy loss (dE/dx). For the material used in this work, the minimum value needed to generate defects lies in 3.6-7.2 keV/nm. A low density core and a high density shell structure can be seen while the radii of tracks are obtained. With increasing the values of dE/dx, the track radius is first increasing and then saturates. Based on the thermal spike model, the process of energy deposited into the material due to electron-phonon coupling is analyzed. By given energy to a cylindrical region, the stress accumulates in this area. And then, a pressure wave emanates outwards, which leads to the atoms in the thermal spike region escaping from the upper and lower surface in the form of clusters. As a consequence, the nanoholes in the track center finally form.
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