Simultaneous measurement of refraction and absorption with an integrated near-infrared Mach–Zehnder interferometer

Antonia Torres-Cubillo,Alejandro Sánchez-Postigo,Jana Jágerská,J. Gonzalo Wangüemert-Pérez,Robert Halir
DOI: https://doi.org/10.1016/j.optlastec.2024.111154
IF: 4.939
2024-05-25
Optics & Laser Technology
Abstract:Most integrated evanescent-field photonic sensors measure changes in either the real part or the imaginary part of the complex refractive index of the sample, i.e., refraction or absorption. Here we propose and experimentally demonstrate a near-infrared sensor based on a silicon nitride Mach–Zehnder interferometer which provides a direct measurement of the complex refractive index. Our architecture exhibits a high sensitivity, achieving limits of detection below 2⋅10−6RIU for both the real and imaginary parts of the refractive index. We furthermore show that our sensor can be employed as an integrated dispersion spectrometer.
optics,physics, applied
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