Measurement of Tungsten Impurity Spectra with a Two-Crystal X-ray Crystal Spectrometer on EAST

He Liang,Chen Jun,Wang Fudi,Cao Jinjia,Zhang Hongming,Fu Jia,Li Yingying,Li Yichao,Bin,Yu Qingjiang,Wan Shunkuan,Yang Jin,Wang Xunyu,Lyu Bo,Gong Xueyu
DOI: https://doi.org/10.1088/2058-6272/ab84ee
2020-01-01
Abstract:Spectral measurement of tungsten (W) impurity is essential to study impurity transport. Therefore, an X-ray crystal spectrometer (XCS) on EAST was used to measure the line spectra from highly ionized W ions. On EAST, both poloidal XCS and tangential XCS have been developed to measure the plasma temperature as well as the rotation velocity. Recently, He-like and H-like argon spectra have also been obtained using a two-crystal setup. W lines are identified in this study. Through a careful analysis, the W lines of 3.9336, 3.9321, and 3.664 angstrom are found to be diffracted by He-like or H-like crystals. The lines are confirmed with the NIST database. We also calculated the ion temperature with Doppler broadening of these lines. The ion temperature from the W lines is entirely consistent with that from Ar line spectra. The measurement of these W line spectra could be used to study W impurity transport in future work.
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