Abstract:Fourier Ptychographic Microscopy (FPM) is a newly proposed computational imaging method aimed at reconstructing a high-resolution wide-field image from a sequence of low-resolution images. These low-resolution images are captured under varied illumination angles and the FPM recovery routine then stitches them together in the Fourier domain iteratively. Although FPM has achieved success with static sample reconstructions, the long acquisition time inhibits real-time application. To address this problem, we propose here a self-learning based FPM which accelerates the acquisition and reconstruction procedure. We first capture a single image under normally incident illumination, and then use it to simulate the corresponding low-resolution images under other illumination angles. The simulation is based on the relationship between the illumination angles and the shift of the sample's spectrum. We analyze the importance of the simulated low-resolution images in order to devise a selection scheme which only collects the ones with higher importance. The measurements are then captured with the selection scheme and employed to perform the FPM reconstruction. Since only measurements of high importance are captured, the time requirements of data collection as well as image reconstruction can be greatly reduced. We validate the effectiveness of the proposed method with simulation and experimental results showing that the reduction ratio of data size requirements can reach over 70%, without sacrificing image reconstruction quality.

Adaptive and efficient Fourier ptychographic microscopy based on information entropy

Effect of spatial spectrum overlap on fourier ptychographic microscopy

Pattern-illuminated Fourier Ptychography Microscopy with a Pattern-Estimation Algorithm.

Adaptive Selection of Illumination Based on 3d Fourier Ptychography

Aberration Correction Method For Fourier Ptychographic Microscopy Based On Neural Network

Fourier ptychographic microscopy with sparse representation

Efficiency-optimized Fourier Ptychographic Microscopy Based on Spectrum Overlap Percentage Analysis

Self-Learning Based Fourier Ptychographic Microscopy

Predictive Searching Algorithm for Fourier Ptychography

High-speed Fourier Ptychographic Microscopy for Quantitative Phase Imaging.

Concept, implementations and applications of Fourier ptychography

Content Adaptive Illumination for Fourier Ptychography

Accelerated and high-quality Fourier ptychographic method using a double truncated Wirtinger criteria.

Adaptive Background Interference Removal for Fourier Ptychographic Microscopy.

Fourier Ptychographic Microscopy Using A Generalized Anscombe Transform Approximation Of The Mixed Poisson-Gaussian Likelihood

Fourier Ptychographic Reconstruction Using Poisson Maximum Likelihood and Truncated Wirtinger Gradient

Fourier Ptychography for High Space-Bandwidth Product Microscopy

Stable and Robust Frequency Domain Position Compensation Strategy for Fourier Ptychographic Microscopy

Correction Algorithms of Pupil Aberration for Fourier Ptychographic Microscopy

Adaptive denoising method for Fourier ptychographic microscopy

Nonlinear Optimization Approach for Fourier Ptychographic Microscopy