Abstract:The advanced RA have effectively mitigated ADC performance degradation under process, voltage, and temperature (PVT) variations [1]–[2]. However, they still necessitate a one-time configuration to rectify inter-stage gain error (ISGE). In light of this, the calibration-free techniques targeting ISGE are developed to further reduce the cost associated with ISGE calibration [1], [3]–[5]. The correlated level shifting (CLS) based techniques enhance gain accuracy through multi-step amplifications [1]. However, the speed is limited by the large level shifting capacitor and phase constraints. Alternatively, dual-residue amplification technique has been introduced to circumvent the need for ISGE calibration [3]–[5]. Among these techniques, the single-RA scheme with two-step amplification proves effective in mitigating the RA mismatch issue observed in the two-RA scheme [3]. In contrast to the current interpolation [4], the capacitive interpolation consumes only dynamic power and exhibits superior energy efficiency [5]. Nonetheless, the capacitive interpolation scheme suffers from complexities in control behavior, which limits its performance when compared to common pipelined-SAR counterparts. This work introduces a one-way switching method, which enables an amenable logic and always constant capacitive digital-to-analog converter (CDAC) implementation in the capacitive interpolation. Additionally, a background offset calibration is presented to correct the offset of the 1st stage comparator and inter-stage offset to near zero. As a result, the calibration need of RA is removed.

An Automatic Slope-Calibrated Ramp Generator for Single-Slope ADCs.

A 14-Bit Column-Parallel Two-Step SA ADC with On-Chip Scaled Reference Voltages Self-Calibration for CMOS Image Sensor

An 18-Bit 2MSPS SAR ADC with Double Passive Noise-Shaping Calibration

A 16-Bit 2.5-Ms/s SAR ADC with On-Chip Foreground Calibration

A 15-Bit, 5 MSPS SAR ADC with On-Chip Digital Calibration

A Calibration Technique Based on Frequency-Domain Characteristics for Pipelined ADCs

A 14-bit 500MS/s and 1GS/s Configurable Pipelined ADC with Background Calibration

A Calibration Scheme for a 800-Ms/s 14 Bit Pipelined ADC in 28-Nm CMOS

Analysis and Improvement of Ramp Gain Error in Single-Ramp Single-Slope ADCs for CMOS Image Sensors

On-chip ramp generators for mixed-signal BIST and ADC self-test

A 14-Bit Column-Parallel Two-Step SA ADC with Digital Calibration Based on Scaled References and Redundancy for CMOS Image Sensors

High Consistency Ramp Design Method for Low Noise Column Level Readout Chain

Two-Step Single-Slope ADC Utilizing Differential Ramps for CMOS Image Sensors

A Gain-Adaptive Single-Slope ADC Employing Column Lateral Capacitors for CMOS Image Sensors

A Single Slope ADC with Row-Wise Noise Reduction Technique for CMOS Image Sensor

A 10-bit 20-Msample/s 49mW CMOS pipelined A/D converter

A Single-Channel 1.25-Gs/s 11-Bit Pipelined ADC with Robust Floating-Powered Ring Amplifier and First-Order Gain Error Calibration.

A high consistency ramp circuit design method for negative feedback adaptive adjustment mechanism applied to large area array CMOS image sensors

A 28.9–38.8 μW dual-mode 10-bit column parallel single-slope ADC with minimum voltage feedback for CMOS image sensors

A 13b 500ms/s Dual-Residue Pipelined-SAR ADC with One-Way Switching Capacitive Interpolation and Background Offset Calibration

A Low-Power Column-Parallel Gain-Adaptive Single-Slope ADC for CMOS Image Sensors