Relative Dissociation Fractions of SF6under Impact of 15-Kev to 30-Kev H−and C−negative Ions
Zilong Zhao,Junqin Li,Xuemei Zhang
DOI: https://doi.org/10.1103/physreva.88.042708
IF: 2.971
2013-01-01
Physical Review A
Abstract:The relative dissociation fractions for the production of fragment ions and ion pairs of SF6 are studied for Hand C-impact in the energy range from 15 to 30 keV. Recoil ions (SF+ 4, SF+ 3, SF+ 2, SF+, S+, F+, SF2+ 4, SF2+ 2) and ion pairs (SF3+ + F+, SF2+ + F+, SF+ + F+, S+ + F+, F+ + F+) are detected and identified in coincidence with scattered projectiles in two charge states (q = 0 and q = + 1) by using a time-of-flight spectrometer. The relative dissociation fractions are energy dependent for both single-electron-loss (SL) channel and double-electron-loss (DL) channel processes for certain negative ions. It is also found that the relative dissociation fractions for DL are larger than those for SL. In addition, the degree of fragmentation will become greater with a larger mass number of the projectiles at the same impact energy for the same electron-loss channel. A comparison of the time-of-flight spectra is made between that under negative-ion impact and that under electron impact, and it is found that the probability of production of SFn2+ ions with n odd is higher than that of similar ions with n even, and the probability of production of SF2+ n ions with n even is higher than that of similar ions withn odd under H-, C-, positive-ion, and electron impact. We analyze this interesting phenomenon from the bond-dissociation energies of SFn+ and SFn2+. We also analyze the coincident time-of-flight spectra of two fragment ions resulting from double ionization of SF6 by H-and C-impact and describe the major dissociation pathways of SF2+ 6 for H-and C-impact in the energy range from 15 to 30 keV.