Abstract:We demonstrate the use of a 4-dimensional scanning transmission electron microscope (4D-STEM) to extract atomic cross section information in amorphous materials. We measure the scattering amplitudes of 200 keV electrons in several representative specimens: amorphous carbon, silica, amorphous ice of pure water, and vitrified phosphate buffer solution. Diffraction patterns are recorded by 4D-STEM with or without energy filter at the zero-loss peak. In addition, Electron Energy Loss Spectroscopy (EELS) data are acquired at several thicknesses and energies. Mixed elastic and inelastic contributions for thick samples can be decoupled based on a convolution model. Measured differential cross sections between 1-3 mrad are due primarily to plasmon excitations and follow precisely a 1/θ 2 angular distribution. The measured intensities match Inokuti's calculations of total dipole matrix elements for discrete dipole transitions alone, i.e., transitions to bound states of the atom and not to continuum states. We describe the fundamental mechanism of plasmon excitation in insulators as a two-step interaction process with a fast electron. First, a target electron in the specimen is excited, the probability for which follows from the availability of atomic transitions, with a strong dependence on the column of the periodic table. Second, the dielectric response of the material determines the energy loss. The energy of the loss peak depends primarily on the valence electrons. Elastic scattering is dominant at higher angles, and can be fitted conveniently to 1/θ 3.7 with a linear dependence on atomic number for light atoms. In order to facilitate the interpretation of 4D STEM measurements in terms of material composition, we introduce two key parameters. Zeta is an analytical equivalent of classical STEM Z-contrast, determined by the ratio of elastic to inelastic scattering coefficients, while eta is the elastic coefficient divided by thickness. The two parameters may serve for identification of basic classes of materials in biological and other amorphous organic specimens.

Differential Cross Sections Of Elastic Electron Scattering From Ch4, Cf4 And Sf6 In The Energy Range 100-700 Ev

Electron Scattering by C4h10 and C6h6 in the Energy Range 100-1000 Ev

An Empirical Formula Approach to Total Cross Sections for Electron Scattering on Polyatomic Molecules

Elastic and Inelastic Electron Scattering Cross Sections of Trichlorofluoromethane

Low-energy Electron Scattering with H2O and NH3 Molecules.

Theoretical Calculation of Differential Cross Section for E+-Ar and E--ar Elastic Scattering

Low Energy (e,2e) Studies from CH4: Results from Symmetric Coplanar Experiments and Molecular Three-Body Distorted Wave Theory.

Comparison of Experimental and Theoretical Electron-Impact-ionization Triple-Differential Cross Sections for Ethane

Low Energy (E, 2e) Study from the 1t(2) Orbital of Ch4

Dynamic Effects in Electron Momentum Spectroscopy of Sulfur Hexafluoride

Theoretical triple differential cross sections for ionization of N 2 and CH 4 molecules by electron impact

Elastic Differential Cross Sections of 1500 Ev Electron Scattering from Helium

Differential and integral elastic cross sections for electrons and positrons collisions with carbon dioxide molecules

Single and Double Electron Detachment Absolute Cross Sections of H− and D− in Collisions with SF6 and CF4

Extraction of Molecular-Frame Electron-Ion Differential Scattering Cross Sections Based on Elliptical Laser-Induced Electron Diffraction

Electron Atomic Scattering Factors, Debye-Waller Factors and the Optical Potential for High-Energy Electron Diffraction

Fully Differential Cross Sections for Electron-Impact Excitation-Ionization of Alignedd2

An Electron Momentum Spectroscopy Study of the Highest Occupied Molecular Orbital of Difluoromethane

Triple Differential Cross Sections for Electron-Impact Ionization of Methane at Intermediate Energy.

Experimental and Theoretical Cross Sections for Molecular-Frame Electron-Impact Excitation-Ionization of D-2

Quantitative atomic cross section analysis by 4D-STEM and EELS