Planar Mid-Infrared InAsSb Photodetector Grown on GaAs Substrates by MOCVD

Tingting Wang,Min Xiong,Yingchun Zhao,Xu Dong,Yu Zhao,Jingjun Miao,Yong Huang,Baoshun Zhang,Lixin Cao,Bohua Dong
DOI: https://doi.org/10.7567/1882-0786/ab507c
IF: 2.819
2019-01-01
Applied Physics Express
Abstract:Planar mid-wavelength infrared photodetectors with InAsSb absorber grown on GaAs substrates are demonstrated. Epilayer growth and diffusion of zinc in InAsSb were carried out in a multi-wafer MOCVD reactor. In addition to the planar p(+)n junction defined by Zn diffusion, a Schottky junction was integrated to reduce the dark current and improve the optical responsivity. At 85;K, a cutoff wavelength greater than 5;?m was achieved and specific detectivity D* was estimated to be 5.0;;10(11);cm?Hz(1/2);W-?1 at 4.1;?m under zero bias condition. Furthermore, the photodetector can operate up to 160;K with a D* of 1.0;;10(9);cm?Hz(1/2);W-?1.
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