Complete Test Suites Generation of CTCS-3 Target Speed Monitor Based on Combinatorial Testing

Kehang Chen,Jidong Lv,Zhengwei Luo,Tao Tang,Shigen Gao
DOI: https://doi.org/10.23919/chicc.2019.8866000
2019-01-01
Abstract:As an one-time braking mode curve, which is generated by the Target Speed Monitor (TSM) in Chinese Train Control System Level 3 (CTCS-3) based on the target speed, target distance, line condition, and train characteristics, performs the core safety critical functions. However, it is characterized by large parameters input domain, complex fault modes, and complicated combinations of various parameters and fault modes, which make it difficult to be effectively and efficiently tested in the train on-board equipment. In this paper, a methodology of complete test suites generated technology for the CTCS-3 TSM has been presented based on combinatorial testing (CT) strategies theory. Firstly, according to the system requirement specification (SRS) of CTCS-3, the combinatorial testing model of CTCS-3 TSM is built, which considering the selection of system parameters and its related constraints. Secondly, one of the combination strategies, in parameter order general (IPOG), is applied to obtain the test suites under different coverage criteria. Finally, the mutation analysis has been introduced to detect the ability of the generated test suites with different faults. We also show some interesting results to compare with the test suites generated by the random testing in the same conditions.
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