Abstract:Raw bit errors are common in NAND flash memory and will increase in the future. These errors reduce flash reliability and limit the lifetime of a flash memory device. We aim to improve flash reliability with a multitude of low-cost architectural techniques. We show that NAND flash memory reliability can be improved at low cost and with low performance overhead by deploying various architectural techniques that are aware of higher-level application behavior and underlying flash device characteristics. We analyze flash error characteristics and workload behavior through experimental characterization, and design new flash controller algorithms that use the insights gained from our analysis to improve flash reliability at a low cost. We investigate four directions through this approach. (1) We propose a new technique called WARM that improves flash reliability by 12.9 times by managing flash retention differently for write-hot data and write-cold data. (2) We propose a new framework that learns an online flash channel model for each chip and enables four new flash controller algorithms to improve flash reliability by up to 69.9%. (3) We identify three new error characteristics in 3D NAND through a comprehensive experimental characterization of real 3D NAND chips, and propose four new techniques that mitigate these new errors and improve 3D NAND reliability by up to 66.9%. (4) We propose a new technique called HeatWatch that improves 3D NAND reliability by 3.85 times by utilizing self-healing effect to mitigate retention errors in 3D NAND.

Reliability Prediction Model of NAND Flash Memory Based on Random Forest Algorithm

Prediction Models of Bit Errors for NAND Flash Memory Using 200 Days of Measured Data

Research on prediction model for NAND flash bit errors

Reliable Memristor-based Neuromorphic Design Using Variation- and Defect-Aware Training

Lifetime Improvement of 28 Nm Resistive Random Access Memory Chip by Machine Learning‐Assisted Prediction Model Collaborated with Resurrection Algorithm

Modeling 3D NAND Flash with Nonparametric Inference on Regression Coefficients for Reliable Solid-State Storage

Modeling Retention Errors of 3D NAND Flash for Optimizing Data Placement

Architectural Techniques for Improving NAND Flash Memory Reliability

FPGA-based Reliability Testing and Analysis for 3D NAND Flash Memory

Prediction of Random Grain Boundary Variation Effect of 3-D NAND Flash Memory Using a Machine Learning Approach

Endurance Prediction Based on Hidden Markov Model and Programming Optimization for 28nm 1Mbit Resistive Random Access Memory Chip

The Method of Predicting Retention Threshold Voltage Distribution for NAND Flash Memory Based on Back-Propagation Neural Network

Research on 3D TLC NAND Flash Reliability from the Perspective of Threshold Voltage Distribution

SREA: A Self-Recovery Effect Aware Wear-Leveling Strategy for the Reliability Extension of NAND Flash Memory

AI-assisted reliability life prediction model for wafer-level packaging using the random forest method

Stock Price Prediction Based on Optimized Random Forest Model.

Exploiting Error Characteristic to Optimize Read Voltage for 3-D NAND Flash Memory

Exploiting Feature Layer for Read Reference Voltage Optimization on 3D NAND Flash Memory

Fixation Ratio of Error Location-Aware Strategy for Increased Reliable Retention Time of Flash Memory.

Storage Reliability of Multi-bit Flash Oriented to Deep Neural Network

PT-LRU: a probabilistic page replacement algorithm for NAND flash-based consumer electronics