Enhanced Interferometric Weak Value Amplification with Multiple Reflection

Lixuan Shi,Tian Guan,Yang Xu,Zhen Qiao,Zhangyan Li,Cuixia Guo,Yanhong Ji,Yonghong He,Nan Zeng
DOI: https://doi.org/10.1109/lpt.2019.2935264
IF: 2.6
2019-01-01
IEEE Photonics Technology Letters
Abstract:A multiple-reflection scheme was proposed to improve the sensitivity and resolution of interferometric weak measurement by introducing a cuboid prism device in the optical path. Increasing the number of reflection in a total internal reflection weak value amplification (WVA) system resulted in a 3.8 fold improvement in the sensitivity of the central wavelength shift to refractive index unit (RIU) (from 1788 nm/RIU to 6821 nm/RIU). Using the multiple reflection device, a RIU resolution of 2.7 x 10-7 RIU was obtained. The real-time deposition process of dopamine is monitored.
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