Design Of A Low Temperature Drift Uvlo Circuit With Base Current Compensation

Haonan Wu,Menglian Zhao,Zhao Yang,Sheng Liu,Xiaobo Wu
DOI: https://doi.org/10.1109/edssc.2019.8754320
2019-01-01
Abstract:A novel Under Voltage Lock Out (UVLO) circuit is proposed in this paper. Compared with traditional bandgap structure UVLO, base current generation and compensation circuits are introduced in this designed UVLO circuit to gain better performance, especially with ultra-low beta. So the temperature drift of V-TH can be minimized, an accurate threshold voltage (V-TH) can be achieved. It is designed by using 0.18 mu m 5V CMOS process. The simulation results show that the V-TH in the proposed circuit is 3.380V, and its deviation is 49mV in the temperature range of -40 similar to 125 degrees C.
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