An improved coupled single-port model to calculate voltage stability margin based on a novel limit condition
Zhenchuan Ma,Shenxi Zhang,Heng Zhang,Lu Liu,Haozhong Cheng
DOI: https://doi.org/10.1016/j.epsr.2024.111122
IF: 3.818
2024-10-04
Electric Power Systems Research
Abstract:With the gradually increase of power system load and renewable energy resources, the Thévenin equivalence-based voltage stability assessment methods have garnered significant attention. Due to the nonlinearity and time-varying nature of power systems, the Thévenin equivalent (TE) parameters are variable. Neglecting the variation during the calculation of voltage stability margin leads to inaccurate calculation results. Meanwhile, it is theoretically incorrect to apply the impedance matching condition to calculate voltage stability margin when the parameters of the TE model are variable. Regarding these two issues, this paper proposes an improved coupled single-port (CSP) model to calculate voltage stability margin based on a novel limit condition. Firstly, an improved CSP model based on Taylor expansion is introduced. The voltages at all buses can be expanded into Taylor series functions of the studied bus's load impedance modulus parametric variable, obtaining the TE voltage and TE impedance of the studied bus. Subsequently, propose a novel voltage stability limit condition, which is used to replace the impedance matching condition. Finally, a voltage stability margin solution framework is established. Experimental results on extensive standard IEEE test systems demonstrate effectiveness of the proposed voltage stability limit condition. The accuracy and efficiency of the proposed improved CSP model is validated by comparisons with the conventional CSP model and continuous power flow (CPF) approach.
engineering, electrical & electronic