Effect of Silicon Dioxide Nano-filler on Dielectric and Space Charge Properties of Epoxy Resin

LI Yuanyuan,TIAN Muqin,LEI Zhipeng,XU Xiaoxiao,WANG Shaofei

DOI: https://doi.org/10.13336/j.1003-6520.hve.20180529019

2018-01-01

Abstract:The effect of nanoparticles on the dielectric and spatial charge properties of epoxy resin was studied. The epoxy resin nanodielectrics with different contents of nano-silicon dioxide (SiO2) from 0％～5％ were prepared by using epoxy resin as a base material and SiO2 as a filler. The dielectric permittivity and dissipation factor depending on frequency in the range from 0.01 Hz to 1 MHz were studied. The space charge behaviors of samples were also observed under dc electric field of 33 kV/mm. When the SiO2 concentrations are 0.5％ and 1％, ER/SiO2 nanodielectrics have lower relative permittivity and dissipation factor compared to neat ER, in the meantime, the accumulation and injection of homocharge were effectively suppressed at the electrode interface. When the SiO2 concentrations are 2.5％ and 5％, ER/SiO2 nanodielectrics have higher relative permittivity and dissipation factor compared to neat ER in the low frequency region, but the change is not obvious in the high-frequency region. At the same time, the space charge accumulation and the injection at the electrode interface increase significantly. The results indicate that the presence of nanoparticles strongly enhances the dielectric and space charge properties of the epoxy resin, which is influenced by the interfacial region between epoxy and nanoparticles. The interfacial region is the key factor in affecting the electrical performances of ER/SiO2 nanodielectrics.