Simultaneous Enhancement of Electrical Performance and Negative Bias Illumination Stability for Low-Temperature Solution-Processed SnO2 Thin-Film Transistors by Fluorine Incorporation

Jun Li,You-Hang Zhou,De-Yao Zhong,Xi-Feng Li,Jian-Hua Zhang
DOI: https://doi.org/10.1109/ted.2019.2936484
IF: 3.1
2019-01-01
IEEE Transactions on Electron Devices
Abstract:In this article, fluorine (F)-doped SnO2 (FTO) thin-film transistors (TFTs) are fabricated by the solution process with a low process temperature (300 degrees C). The FTO film characteristic, TFT electrical performance, and stability under the negative bias illumination stress (NBIS) are improved by F doping. The enhancement in electrical performance and stability is because F can substitute oxygen atom in the lattice and oxygen vacancies in FTO system. The FTO TFT with 3 mol.% F doping ratio shows superior electrical performance with saturation mobility (mu) of 14.48 cm(2)/V.s, a threshold voltage (V-TH) of 1.01 V, a subthreshold swing (SS) of 0.19 V/decade, and an ON/OFF current ratio (I-on/I-off) of 9.32 x 10(7). Furthermore, the 3 mol.% FTO TFT shows only -0.8 V V-TH shift under NBIS. The total density of states (DOSs) for the FTO TFT is extracted in order to further verify the stability improvement based on the temperature-dependencefield-effectmeasurement. The results indicate that the simple solution-processedFTO-TFT is promising for application in electronics.
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