Polarization‐Sensitive Ultraviolet Detection from Oriented‐CdSe@CdS‐Dot‐in‐Rods‐Integrated Silicon Photodetector

Yong Ge,Mengjiao Zhang,Lei Wang,Linghai Meng,Jialun Tang,Yu Chen,Lingxue Wang,Haizheng Zhong
DOI: https://doi.org/10.1002/adom.201900330
IF: 9
2019-01-01
Advanced Optical Materials
Abstract:Polarization can be used to distinguish artificial objects in complicated environments. The development of polarization-sensitive detection at ultraviolet (UV) wavelengths has been substantially delayed by the difficulties in fabricating anisotropic materials and optical elements for polarization modulation. Polarization-sensitive UV detection is developed by combining an electron-multiplying charge-coupled device (EMCCD) with a polarized luminescence downshifting material that benefits from an oriented-CdSe@CdS-dot-in-rods-embedded polyvinylidene fluoride (PVDF) composite film. With mechanical-stretching-induced orientation, the composite film shows emission polarization with an optimized ratio up to 0.52 +/- 0.02. This integrated detection system can respond to linearly polarized 405 nm light with a signal difference up to 23%, showing its potential for use in UV polarization-enhanced imaging for object recognition.
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