Abstract:In this research, the automatic optical detection system is developed for detecting the sectional profile and the surface of the thin-film transistor liquid crystal display (TFT-LCD) panels after being treated through the cutting process. Traditional image processing inspection relying on pre-determined thresholding cannot achieve ideal results in slight defects in glass substrates. The proposed image pre-processing process was integrated with the deep learning technique to further enhance the detection process of inconspicuous defects in glass substrates. In addition, the photoelastic reflection lighting technique was used to highlight subtle defects in low-contrast surface images of glass substrates. When tested with the sectional profile photodetector, uniformed lighting effect is achieved by combining the concentrated light source of the inner coaxial lens with the line light source in order to test the surface coarseness-related characteristics of the glass sectional profile so as to indicate the defect while intensifying the contrast effect of the sectional profile background. When detecting the sectional profile features, it is conducted by separating the rib mark features through the U-Net network model developed for the deep learning; in result, 100% accuracy can be achieved. When detecting the sectional profile defect, Auto Encoder network model of the deep learning is used to learn the background picture retrieved from the original picture through the linear regression process. As a next step, the model is used again to predict the result by subtracting the background picture from the original picture, and then the defect position is highlighted; as a result, 98% accuracy is achieved. When detecting the model acceleration, it is conducted by revising the model weighting data format. In terms of U-Net Model, the reading time has been shortened for 4.28 s; in individual picture, the prediction time has been shortened for 0.29 s; in Auto Encoder, the model reading time has been shortened for 19.23 s; and the individual picture prediction time has been shortened for 0.94 s. As for the surface detection, the circular polariscope is developed. During the detection, the photoelastic reflection theory is employed by projecting the circularly polarized light vertically onto the panel surface in order to produce the interfering halo at the deformed area surrounding the denting defect, and the resulting features are referenced to identify the denting defect. By screening the mean luminance value of the sliding window and the discrete value, 90% detection accuracy can be achieved. In the meantime, it can also be used to pinpoint the denting defect that is over 3° in average angle change as seen on the normal line surrounding the defect.

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