Quantum Zeno Effect in a Circuit-Qed System

Shu He,Li-Wei Duan,Chen Wang,Qing-Hu Chen
DOI: https://doi.org/10.1103/physreva.99.052101
IF: 2.971
2019-01-01
Physical Review A
Abstract:We study the quantum Zeno effect of the circuit-QED system at finite temperature for both selective measurement and nonselective measurement proposals. For the selective measurement proposal, we explicitly show that the counter-rotating terms (CRTs) become as significant as rotating wave terms (RWTs) with increase of temperature. We also derive an analytic expression for the survival probability which correctly captures the leading contribution for both RWTs and CRTs in the frequent measurement limit. Beyond this limit, we observe a nonexponential decay of the survival probability by further considering the effect of the variation of initial states during repeated measurements. For the nonselective measurement proposal, we find that the survival probability demonstrates the same behavior as in the selective measurement case in the short-time regime while it deviates from an exponential form and approaches a nonvanishing value in the long-time scale due to the repopulation effect.
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