Fatigue Reliability Analysis and Design for Structural Components in Quasi-One-Shot Device

Haiqiao Wang,Min Chen,Xiaofei Yao,Zhiyuan Liu,Xiang Wang,Derrick Tate
DOI: https://doi.org/10.1002/pamm.201800410
2018-01-01
PAMM
Abstract:The reliability of the quasi‐one‐shot device is a crucial index and hard to predict due to its complexity and cost‐consuming of testing. In this paper, a bi‐directional approach of reliability optimization design (ROD), integrating stress‐strength interference model and fatigue analysis, was proposed to evaluate and optimize the weakest component of the quasi‐one‐shot device. High‐voltage vacuum circuit breaker was used as a numerical validation example.
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