Reliability Of Anti-Lid Technology For Commercialized B-Doped Perc Solar Cells

Chuanke Chen,Jin Yang,Wenshuang He,Hong Yang,He Wang,Jun Lv,Jianbo Wang,Mingchang Ding
DOI: https://doi.org/10.1109/pvsc.2018.8547424
2018-01-01
Abstract:This paper focus on the mitigation of light induced degradation (LID) in commercial Boron doped high efficiency PERC solar cells. Particular attentions are paid to the conduct of LID for B-doped PERC cells at different temperatures before and after anti-LID treatments. Research results in this present can be concluded as follows: (1) the trend of LID for B-doped PERC solar cells is related on the temperature of light soaking rather than the base resistivity of the wafers used; (2) thermal process in the absence of light and anneal process with deliberate addition of carrier injection can change the LID conduct of B-doped PERC cells under high temperature condition.
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