Thickness Dependent Dielectric and Piezoelectric Properties of BNT–BT–ST Thin Films

Wei Li,Zhijun Xu,Ruiqing Chu,Jigong Hao,Peng Fu,Juan Du,Zhenxing Yue
DOI: https://doi.org/10.1080/00150193.2017.1362211
2017-01-01
Ferroelectrics
Abstract:0.755Bi(0.5)Na(0.5)TiO(3)-0.065BaTiO(3)-0.18SrTiO(3) (BNT-BT-ST) thin films with various thicknesses were grown by sol-gel process. The effects of thickness on structure and electric properties of the films were investigated. The films with lower thickness (<= 300 nm) show (200) orientation and smaller grain size, while the ralative thicker films(>= 450 nm) show random orientation and bigger grain size. The leakage current decreases with the increase of thickness. The dielectric, ferroelectric and piezoelectric properties enhance as the thickness increases, which are attributed to the relaxed strain and domain wall motion. The maximum piezoelectric constant is 120 pm/V.
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