Experimental Investigation of Piezoresistive Effect in P-Type 4H–sic

Tuan-Khoa Nguyen,Hoang-Phuong Phan,Toan Dinh,Jisheng Han,Sima Dimitrijev,Philip Tanner,Abu Riduan Md Foisal,Yong Zhu,Nam-Trung Nguyen,Dzung Viet Dao
DOI: https://doi.org/10.1109/led.2017.2700402
IF: 4.8157
2017-01-01
IEEE Electron Device Letters
Abstract:This letter presents for the first time the piezoresistive effect in p-type 4H–SiC. Longitudinal and transverse p-type 4H–SiC piezoresistors with a doping concentration of $10^{18}$ cm $^{-3}$ were fabricated along [ $1\overline {1}00$ ] directions. Ni/Al electrodes annealed at 1000 °C showed a good ohmic contact, and then, the longitudinal and transverse gauge factors were found to be as high as 31.5 and −27.3, respectively. The large gauge factors, attributed to the change of valance energy bands upon application of mechanical strain, and the linear relationship between the resistance change versus induced strain demonstrate the potential of p-type 4H–SiC for mechanical sensing applications.
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