Microstructure and Electrical Conductivity of (Y, Sr)CoO3-δ Thin Films Tuned by the Film-Growth Temperature

Hong-Mei Jing,Guang-Liang Hu,Shao-Bo Mi,Lu,Ming Liu,Shao-Dong Cheng,Sheng Cheng,Chun-Lin Jia
DOI: https://doi.org/10.1016/j.jallcom.2017.04.192
IF: 6.2
2017-01-01
Journal of Alloys and Compounds
Abstract:Epitaxial films composed of (Y,Sr)CoO3-delta and nano-scale Y2O3 columns are successfully grown on (La0.289Sr0.712)(Al0.633Ta0.356)O-3(001) substrates at 900 degrees C. The microstructural and electrical properties of the composite films are investigated and compared with those of the single-phase films prepared at 800 degrees C. In the composite films oxygen vacancies are detectable, which occur alternately in the stacking CoO2-delta planes of (Y,Sr)CoO3-delta. In addition, it is found that a large number of misfit dislocations distribute at the interfaces between the Y2O3 columns and the (Y,Sr)CoO3-delta film matrix. The measured resistivity of the composite films is significantly lower than that of the (Y,Sr)CoO3-delta single-phase films. Our results indicate that the electrical properties of the perovskite-based cobaltates films can be tuned by changing the microstructure through controlling the film-growth temperature. (C) 2017 Elsevier B.V. All rights reserved.
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