The Xafs Beamline of Ssrf
Yu Hai-Sheng,Wei Xiang-Jun,Li Jiong,Gu Song-Qi,Zhang Shuo,Wang Li-Hua,Ma Jing-Yuan,Li,Gao Qian,Si Rui,Sun Fan-Fei,Wang Yu,Song Fei,Xu Hong-Jie,Yu Xiao-Han,Zou Yang,Wang Jian-Qiang,Jiang Zheng,Huang Yu-Ying
DOI: https://doi.org/10.13538/j.1001-8042/nst.26.050102
2015-01-01
Abstract:The BL14W1 beamline at Shanghai Synchrotron Radiation Facility (SSRF) is an X-ray absorption fine-structure (XAFS) beamline, for investigating atomic local structure, which is demanded extensively in the fields of physics, chemistry, materials science, environmental science and so on. The beamline is based on a 38-pole wiggler with the maximum magnetic field of 1.2 T. X-rays of 4.5-40 keV can be extracted by the optical scheme consisting of white beam vertical collimating mirror, liquid-nitrogen-cooled double crystal monochromator of Si(111) and Si(311), toroidal focusing mirror and higher harmonics rejection mirror. The maximum photon flux about 5 x 10(12) photons/s at the sample at 10 keV, with a beam size of 0.3 mm x 0.3 mm. The beamline is equipped with four types of detectors for experiments in either transmission or fluorescence mode. At present, quick-XAFS, grazing incidence XAFS, X-ray emission spectroscopy, high-pressure XAFS and time-resolved X-ray excited optical luminescence methods have been developed.