Chemical Force Titration:A New Approach for Characterizing the Surface Dissociation Properties of Self-Assembled Monolayers

ZHANG Hua,HE Hui-xin,LIU Zhong-fan
DOI: https://doi.org/10.3969/j.issn.1000-6281.1999.01.011
1999-01-01
Abstract:Chemical force microscopy(CFM) was used to measure the adhesion force between ω mercaptoundecanol(HS (CH 2) 11 OH) self assembled monolayer(SAM) modified tip and ω mercaptoundecanoic acid (HS (CH 2) 10 COOH) SAM on gold (shortly OH/ COOH),HS (CH 2) 10 COOH SAM modified tip and HS (CH 2) 11 OH SAM on gold(shortly COOH/ OH),and HS (CH 2) 11 OH SAM modified tip and a silicon substrate functionalized with NH 2 groups (shortly OH/ NH 2) in phosphate buffer solutions.The force titration curves, the plots of adhesion force versus pH value of solution, were obtained. Form the force titration curve of OH/ COOH ( COOH/ OH) and OH/ NH 2 respectively,the dissociation constant pK 1/2 values of surface COOH and NH 2 groups were obtained. Comparing with the results obtained from the conventional contact angle titration, it shows that the force titration technique embodied highly local properties of the surface groups of SAM.
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