Direct measurement of chemical bond energy using chemical force microscopy

Xui-xin HE,Hai-feng CHEN,Hua ZHANG,Yong CHEN,Zhong-fan LIU
DOI: https://doi.org/10.3969/j.issn.1000-6281.1999.01.014
1999-01-01
Abstract:A novel aproach based on chemical force microscopy(CFM) was proposed for directly measuring the Au S bond energy in thiol self assembled monolayers on gold.Experiments were configured as follows.A HS(CH 2) 6 SH SAM on gold was first prepared on gold substrate, and a commercial Si 3N 4 tip was sputter coated by Au film,which was employed as the CFM tip.Under the experimental condition mimicking the SAM formation process, the adhesion force between the Au coated tip and the SH terminated surface was measured by CFM,which is believed to reflect the bonding strength of Au S linkage.With the help of JKR adhesion theory, we determined the Au S bond energy to be 34kcal/mol,in nice agreement with the thermodynamiclly evaluated result.The method developed here can be applied to many other systems together with suitable molecular designs and surface modifications.
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