Intrinsic Relationship Between Electronic Structures and Phase Transition of SrBi2−xNdxNb2O9 Ceramics from Ultraviolet Ellipsometry at Elevated Temperatures

Z. H. Duan,K. Jiang,L. P. Xu,Y. W. Li,Z. G. Hu,J. H. Chu
DOI: https://doi.org/10.1063/1.4864715
IF: 2.877
2014-01-01
Journal of Applied Physics
Abstract:The ferroelectric orthorhombic to paraelectric tetragonal phase transition of SrBi2−xNdxNb2O9 (x = 0, 0.05, 0.1, and 0.2) layer-structured ceramics has been investigated by temperature-dependent spectroscopic ellipsometry. Based on the analysis of dielectric functions from 0 to 500 °C with double Tauc-Lorentz dispersion model, the interband transitions located at ultraviolet region have shown an abrupt variation near the Curie temperature. The changes of dielectric functions are mainly due to the thermal-optical and/or photoelastic effect. Moreover, the characteristic alteration in interband transitions can be ascribed to distortion of NbO6 octahedron and variation of hybridization between Bi 6s and O 2p states during the structure transformation.
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