Radiation Charging Simulation of Alumina Ceramic Irradiated by Intense Pulsed X-ray

Yuqi Zhang,Yu Chen,Yuxin Yang,Yihan Zhao,Xiaofeng Zhu

DOI: https://doi.org/10.1109/icd.2018.8514651

2018-01-01

Abstract:In the vacuum devices of special weapons, alumina ceramic mainly determine the insulation functionality. Thus, its insulating properties under pulsed X-ray is very important. In this paper, the radiation charging of alumina ceramic is calculated when irradiated by intense pulsed X-ray. The dose rate of X-ray is $10^{10}\mathrm {r}\mathrm {a}\mathrm {d}/\mathrm {s}$ and the pulse time is $80\mathrm {n}\mathrm {s}$. Monte Carlo software is used to model the radiation process. To generate the X-ray, a circle aerial electron source shoots a target made of tantalum. Then, the X-ray hit the alumina ceramic sample. The results show that most of the charges deposit on the surface of the sample, which can reach $(1.3\pm 0.1)\times 10^{-7}\mathrm {C}$ and the maximum surface charge density is up to $(5.52\pm 0.02)\times 10^{-5}\mathrm {C}/\mathrm {m}^{2}$. These type of deposit charges can cause an apparent rise in surface potential and decrease flashover voltage along the surface. All of these will seriously weaken the normal operating of the vacuum electronic device. The result shows that the technique apply in this paper is appropriate.