Ultrasonic Testing of Thin Layered Structure Based on Marr Wavelet Analysis

LIN Li,NIE Ying,LI Xi-meng
DOI: https://doi.org/10.3969/j.issn.1001-4381.2007.02.010
2007-01-01
Abstract:It is difficult to recognize the overlapping signal of the front and bottom echoes from the thin layer structure. In order to measure the thickness of the thin layer, wavelet transform modulus maxima method based on Marr wavelet is utilized for the ZrO_2 ceramic coating with the thickness ranging from 250μm to 350μm.The results of ultrasonic method accords with that of metallographical results.
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