A FAST DEFECTS-LOCALIZATION METHOD IN CT IMAGES

冷帅,张丽,陈志强,孙少华
DOI: https://doi.org/10.3969/j.issn.1007-1482.2003.02.011
2003-01-01
Abstract:In this paper, a method based on fractal geometry is investigated to locate defects in the gray-level image acquired by Industrial Computed Tomography. Blanket technology is used to compute the fractal area. Box dimension is gotten by least squares fit line. Some experiments are done and the results indicate that this method is simple, timesaving and suitable for locating defects.
What problem does this paper attempt to address?