A Study of the Test-Suite Reduction Models with Fault Severity Levels

CHEN Chuan-bo,GU Tao,YU Zhi-bin
DOI: https://doi.org/10.3969/j.issn.1007-130X.2008.03.034
2008-01-01
Abstract:Every change to an evolving program will cause the size of the test-suite to grow. Rerunning all of the test cases in the test-suite will be very expensive. So some algorithms are invented to reduce the test-suite. These algorithms can find out a reduced test-suite that provides the same coverage degree as the original test-suite.However, the capability of the reduced test-suite to reveal errors is not very satisfying. The capability of the test cases to detect errors can be given a more accurate evaluation by incorporating the fault severity levels. In this paper, we incorporate the fault severity levels into a bi-criteria model for test-suite reduction to improve the model’s performance on fault-detection, and then propose a new test-suite reduction algorithm. The improved model can provide more detailed information for evaluating the capability of the test cases to reveal faults,while the new algorithm has a feature that the reduced test suite satisfies the adequate coverage degree no matter when the algorithm is terminated.
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