Lithium Trapping As a Degradation Mechanism of the Electrochromic Properties of All-Solid-state WO3//NiO Devices

Dongmei Dong,Wenwen Wang,Aline Rougier,Antoine Barnabe,Guobo Dong,Fan Zhang,Xungang Diao
DOI: https://doi.org/10.1039/c8tc01372a
IF: 6.4
2018-01-01
Journal of Materials Chemistry C
Abstract:There has been keen interest for years in the research of all-solid-state transmittance-type electrochromic (EC) devices due to their various applications especially in “smart windows”. However, limited durability remains a severe issue.
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