Doubling the ZT Record of TiS2-based Thermoelectrics by Incorporation of Ionized Impurity Scattering

Yifeng Wang,Lin Pan,Chao Li,Ruoming Tian,Rong Huang,Xiaohui Hu,Changchun Chen,Ningzhong Bao,Kunihito Koumoto,Chunhua Lu
DOI: https://doi.org/10.1039/c8tc00914g
IF: 6.4
2018-01-01
Journal of Materials Chemistry C
Abstract:TiS2–xAgSnSe2 composites showed an ionized impurity scattering as indicated by the growth of exponent m in electrical conductivity σ ∝Tm (400–580 K), which favored a new record ZTmax ∼ 0.8 for TiS2-based TEs.
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