Spatially Resolved X-ray Photoemission Electron Microscopy of Weyl Semimetal NbAs

Hongwen Liu,Guanhua Zhang,Pierre Richard,Lingxiao Zhao,Gen-Fu Chen,Hong Ding
DOI: https://doi.org/10.1021/acs.cgd.8b00653
IF: 4.01
2018-01-01
Crystal Growth & Design
Abstract:We utilized X-ray photoemission electron microscopy (XPEEM) and X-ray photoelectron spectroscopy (XPS) to investigate the crystal surface of Weyl semimetal NbAs. XPEEM images present white and black contrast in both the Nb 3d and As 3d core level spectra. Surface-sensitive XPS spectra indicate that the entire surface of the sample contains both surface states of Nb 3d and As 3d, in the form of oxides, and bulk states of NbAs. Estimated atomic percentage values n(Nb)/n(As) suggest that the surface is Nb-rich and different for white and black areas.
What problem does this paper attempt to address?