Towards Gamma-Effect Elimination in Phase Measurement Profilometry

Abel Kamagara,Xiangzhao Wang,Sikun Li
DOI: https://doi.org/10.1016/j.ijleo.2018.07.059
IF: 3.1
2018-01-01
Optik
Abstract:For the past few decades or so, tremendous research effort has been directed towards correction and compensation for system errors in phase map retrieval due to gamma-effect of the digital light processing projector used in the measurement system setup. In this paper, an update on the state-of-the-art in finding solution to the well-known nonlinear gamma problem and related effects in digital fringe projection profilometry is discussed. Using numerical experiments and illustrative simulations, recent progresses, developments, and shortcomings in remedying the gamma and its related effects in optical phase-shifting measurement profilometry using digital fringe projection techniques is broached, demonstrated, and reviewed. We further encompass the fundamental principles adopted in various nonlinear gamma calibration techniques together with viable possibilities for prospective research in optical fringe-projection metrology with phase measurement techniques.
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