Abstract:In a digital stripe projection structured light system, the nonlinear phase error is generated by the gamma effect of both the projector, camera, and other electronic devices. One of the existing nonlinear correction methods is active correction by projecting ideal fringes as far as possible, and the other is passive compensation after capturing aberrant fringes. The former has higher accuracy but needs to capture a large number of fringe patterns, while the latter does not need many fringe patterns, but is not only greatly affected by random noise and out-of-focus effects, but also has poor accuracy. In this paper, an optimal algorithm for eliminating nonlinear error based on global statistical phase feature function (GSPF) is proposed. The phase distribution can be estimated from the difference between the global cumulative distribution function and the normalized cumulative distribution function. For an ideal fringe pattern without nonlinear error and a fringe pattern with nonlinear error, the region wrapped by the x-axis normalized cumulative distribution function is much smaller than the region wrapped by the x-axis global cumulative distribution function, and the larger the nonlinear error is, the larger the difference between the two is. Therefore, the global statistical phase feature function can be used for nonlinear error correction. Then the optimal nonlinear error correction is performed based on the minimum difference between the compensated phase entropy and the ideal phase entropy. The method does not require too many steps of phase-shifting, and only three fringe patterns are needed to realize accurate and robust correction. Experimental results show that the method is fast, highly accurate and robust. Using this technique, high accuracy measurements can be achieved with the traditional three-step phase-shifting algorithm.

Full-field phase error detection and compensation method for digital phase-shifting fringe projection profilometry

Phase Error Correction by &Lt;inline-Formula><math Display="inline" Overflow="scroll"><mi>π</mi></math></inline-Formula>-shift Odd-Step Fringe Projection and Speckle Filtering in Phase Measuring Profilometry

Real-time Motion-Induced Error Reduction for Phase-Shifting Profilometry with Projection Points Tracking Method

Nonlinear Effect of the Structured Light Profilometry in the Phase-Shifting Method and Error Correction

High accuracy phase error compensation for digital fringe projection profilometry

Full-field Phase Error Analysis and Compensation for Nonsinusoidal Waveforms in Phase Shifting Profilometry with Projector Defocusing

Phase Error Compensation and Accuracy Analysis for Phase Measurement Profilometry

Nonlinear error full-field compensation method for phase measuring profilometry

A Convenient Look-Up-table Based Method for the Compensation of Non-Linear Error in Digital Fringe Projection

A Phase Error Compensation for Structured Light 3D Profile Measurement

A multi-frequency inverse-phase error compensation method for projector nonlinear in 3D shape measurement

Multiple-gamma-value Based Phase Error Compensation Method for Phase Measuring Profilometry

Phase error compensation for a 3-D shape measurement system based on the phase-shifting method

Improved Dual-Frequency On-Line Phase Measuring Profilometry Based On Full-Cycle Equal Phase-Shift Algorithm

Gamma Precorrection and Phase Error Compensation Methods Based on Three-Frequency with Three-Phase Shift

A new method for compensating phase-shifting error in phase measuring profilometry

Reduction of Phase Error Caused by Overexposure in Phase Measurement Profilometry

The Optimal Algorithm for Eliminating Nonlinear Error in Phase Measurement profilometry Based on Global Statistical Phase Feature Function

Phase Error Elimination Considering Gamma Nonlinearity, System Vibration, and Noise for Fringe Projection Profilometry

Black-Box Phase Error Compensation for Digital Phase-Shifting Profilometry

An efficient phase error self-compensation algorithm for nonsinusoidal gating fringes in phase-shifting profilometry