A new method for traveling memory address based on vector function

Qingwen Zhang,Yun Xu,YuXiang Zhang,Zhimin Zeng,Mingming Li,Yuan Wu
DOI: https://doi.org/10.1109/CSTIC.2018.8369187
2018-01-01
Abstract:MBIST (Memory Built-In Self-Test) design can reduce the cost of the test by improving the efficiency of test and program development. In many cases, MBIST design will pay more attention to test efficiency and less consideration for the convenience of EFA (Electrical Failure Analysis). Correspondingly, MBIST design the function of internal comparison with address automatic accumulation module, but this module is often not open to output function which bring inconvenience to EFA. Memory EFA relies heavily on bitmap function, that means we must send memory address serially and cumulatively. For some Graphic Interface Testers, the bitmap is highly dependent on the storage depth of VECTOR which increases exponentially when address width added. This article describes a method that traveling all the addresses of a large memory based on smaller VECTOR space.
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