Abstract:Accelerated degradation testing (ADT) is commonly used to obtain degradation data under the hasher than normal usage conditions, and to assess lifetime and reliability for high reliable and long life products in a short time. The optimal design for ADT is to propose the test plan based on the performance degradation process with a reasonable optimal criteria and the constraints of test resources. Both the traditional ADT optimal design and Bayesian ADT optimal design are similar that the historical data is needed to determine the initial values or the prior distributions of the model parameters. However, it may be inaccurate to estimate the parameter values or the prior distributions only according to the historical information, which will result in large deviations between the parameter values or the prior distributions and the actual ones. Therefore, the optimal plan could not meet the statistical accuracy. In this paper, we propose a Bayesian ADT dynamic optimal design method with sequential stress. The degradation information under the most recent stress level will be treated as the prior of the next stress level. Under the assumption of Wiener process, an optimal model with the objective of quadratic loss function is built with the decision variables, e.g. stress levels and inspection times. Finally, the simulation study is introduced to illustrate the proposed method, and the results show that Bayesian ADT optimal design with sequential stress can adjust the test plan dynamically to improve the test efficiency.

STATISTICAL ANALYSIS OF CONSTANT-STRESS ACCELERATED DEGRADATION TESTING WITH MULTIPLE PERFORMANCE PARAMETERS

Stochastic Modeling and Analysis of Multiple Nonlinear Accelerated Degradation Processes through Information Fusion

Life and Reliability Forecasting of the CSADT Using Support Vector Machines

Design of Accelerated Degradation Testing with Multiple Stresses Based on D Optimality

A Random Fuzzy Accelerated Degradation Model and Statistical Analysis.

Optimal Design of ADT Based on Non-Parametric Statistics

Mixed Stochastic Process Modelling for Accelerated Degradation Testing

Multiple stresses optimization design of constant-stress accelerated degradation test based on Wiener process

SLD Constant-Stress ADT Data Analysis Based on Time Series Method

A General Accelerated Degradation Model Based On The Wiener Process

Statistical Bayesian Method for Reliability Evaluation Based on ADT Data

Planning of Step-Stress Accelerated Degradation Test with Stress Optimization

Optimal design for step-stress accelerated degradation testing with competing failure modes

Optimal Constant-Stress Accelerated Degradation Test Plans Using Nonlinear Generalized Wiener Process

Step-Stress ADT data estimation based on time series method

Optimal design of constant‐stress accelerated degradation tests based on the Wiener process with manufacturing batches heterogeneity and individual differences

Optimal step stress accelerated degradation tests with the bivariate inverse Gaussian process

Optimization of the Test Stress Levels of an Adt

Optimal Design for Accelerated Degradation Tests with Several Stresses Based on Wiener Process

Accelerated Degradation Testing Optimal Design Based on Uncertain Process

Bayesian Optimal Design of Sequential Stress Accelerated Degradation Testing