Abstract:Accelerated degradation testing (ADT) is commonly used to obtain degradation data under the hasher than normal usage conditions, and to assess lifetime and reliability for high reliable and long life products in a short time. The optimal design for ADT is to propose the test plan based on the performance degradation process with a reasonable optimal criteria and the constraints of test resources. Both the traditional ADT optimal design and Bayesian ADT optimal design are similar that the historical data is needed to determine the initial values or the prior distributions of the model parameters. However, it may be inaccurate to estimate the parameter values or the prior distributions only according to the historical information, which will result in large deviations between the parameter values or the prior distributions and the actual ones. Therefore, the optimal plan could not meet the statistical accuracy. In this paper, we propose a Bayesian ADT dynamic optimal design method with sequential stress. The degradation information under the most recent stress level will be treated as the prior of the next stress level. Under the assumption of Wiener process, an optimal model with the objective of quadratic loss function is built with the decision variables, e.g. stress levels and inspection times. Finally, the simulation study is introduced to illustrate the proposed method, and the results show that Bayesian ADT optimal design with sequential stress can adjust the test plan dynamically to improve the test efficiency.

Mixed Stochastic Process Modelling for Accelerated Degradation Testing

Stochastic Modeling and Analysis of Multiple Nonlinear Accelerated Degradation Processes through Information Fusion

A General Accelerated Degradation Model Based On The Wiener Process

Dynamic Weight-Based Accelerated Test Modeling for Fault Degradation and Lifetime Analysis

Modeling Accelerated Degradation Data Based on the Uncertain Process

A Random Fuzzy Accelerated Degradation Model and Statistical Analysis.

Model Uncertainty in Accelerated Degradation Testing Analysis

Optimal Design for Accelerated Degradation Tests with Several Stresses Based on Wiener Process

Statistical Bayesian Method for Reliability Evaluation Based on ADT Data

Bayesian Optimal Design of Sequential Stress Accelerated Degradation Testing

Mechanism Equivalence Analysis for Accelerated Degradation Tests Based on Tweedie Exponential Dispersion Process

Reliability modeling and statistical inference of accelerated degradation data with memory effects and unit-to-unit variability

A Generalized Testing Model for Interval Lifetime Analysis Based on Mixed Wiener Accelerated Degradation Process

Accelerated Degradation Testing for Lifetime Analysis Considering Random Effects and the Influence of Stress and Measurement Errors

Accelerated degradation model based on geometric Liu process

Uncertain Random Accelerated Degradation Modelling and Statistical Analysis with Aleatory and Epistemic Uncertainties from Multiple Dimensions

A Test Method for Failure Mechanisms Consistency of Accelerated Degradation Test Based on Wiener Process

Evaluation Method for Accelerated Degradation Testing with Interval Analysis

A new processing method for accelerated degradation data based on quantile regression and pseudo-failure lifetime.

Uncertain differential equation based accelerated degradation modeling

Optimal designs of accelerated degradation tests with random shock failures and measurement errors