Research on the shear band suppression mechanism in strut-based lattice structures by oblique graded design
Yifan Zhu,Fengxiang Xu,Libin Duan,Baolin Ma,Yegang Liu,Xiaoqiang Niu,Zhen Zou
DOI: https://doi.org/10.1080/15376494.2024.2396082
2024-08-30
Mechanics of Advanced Materials and Structures
Abstract:Under compressive loads, shear band formation in lattice structures can lead to stress fluctuations, resulting in a decrease in energy absorption capacity. To specifically suppress shear bands, it is necessary to expound the formation mechanisms. This study used theoretical analysis, experiments, and finite element (FE) simulations to elucidate the mechanism underlying shear band formation in strut-based lattice structures. It was determined that stress concentration at strut joints along the 45° diagonal plane induced shear deformation. Shear bands were most pronounced along the four body diagonals, and their existence diminished as the distance from the diagonal increased. Therefore, a design of oblique graded lattice structure (OGLS) was proposed, and quasi-static compression experiments were performed using FE method. The results showed that the main internal stress of OGLS is combined with the original 45° shear stress and the annular staggered stress produced by the oblique graded design, which constrains each other and avoids mutual dislocation deformation, thus realizing shear band suppression. However, an excessively large graded coefficient excessively weakens the 45° shear stress and results in the appearance of an annular compact band. By optimizing the graded coefficient based on the deformation consistency of the outer contour, the optimized OGLS exhibited significant improvements in yield strength, plateau stress, and energy absorption, which are increased by 36.06%, 39.29%, and 34.41%, respectively. This research offers novel perspectives on how lattice structures can attain stable compression deformation and a high energy absorption capacity.
materials science, multidisciplinary,mechanics, composites, characterization & testing